S.R. Das, M. Assaf, E. Petriu, W. Jone, K. Chakrabarty
{"title":"一种基于开关理论公式的无混叠空间压缩器设计新方法","authors":"S.R. Das, M. Assaf, E. Petriu, W. Jone, K. Chakrabarty","doi":"10.1109/IMTC.2001.928812","DOIUrl":null,"url":null,"abstract":"This paper suggests a novel approach to designing zero-aliasing space compactors utilizing switching theory concepts of Hamming distance, sequence weights, cover table and frequency ordering, together with concept of Nth order missed error probability estimates under stochastic dependence of line errors for detectable single stuck line faults of the CUT. The advantages of aliasing-free space compaction over earlier techniques are evidently clear-zero-aliasing is achieved without any modifications of the CUT, the area overhead and signal propagation delay are relatively less compared to conventional parity tree linear compactors, and the approach used works equally well with both deterministic and pseudorandom test sets.","PeriodicalId":68878,"journal":{"name":"Journal of Measurement Science and Instrumentation","volume":"221 1","pages":"198-203 vol.1"},"PeriodicalIF":0.0000,"publicationDate":"2001-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":"{\"title\":\"A novel approach to designing aliasing-free space compactors based on switching theory formulation\",\"authors\":\"S.R. Das, M. Assaf, E. Petriu, W. Jone, K. Chakrabarty\",\"doi\":\"10.1109/IMTC.2001.928812\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper suggests a novel approach to designing zero-aliasing space compactors utilizing switching theory concepts of Hamming distance, sequence weights, cover table and frequency ordering, together with concept of Nth order missed error probability estimates under stochastic dependence of line errors for detectable single stuck line faults of the CUT. The advantages of aliasing-free space compaction over earlier techniques are evidently clear-zero-aliasing is achieved without any modifications of the CUT, the area overhead and signal propagation delay are relatively less compared to conventional parity tree linear compactors, and the approach used works equally well with both deterministic and pseudorandom test sets.\",\"PeriodicalId\":68878,\"journal\":{\"name\":\"Journal of Measurement Science and Instrumentation\",\"volume\":\"221 1\",\"pages\":\"198-203 vol.1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"32\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Measurement Science and Instrumentation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2001.928812\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Measurement Science and Instrumentation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2001.928812","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel approach to designing aliasing-free space compactors based on switching theory formulation
This paper suggests a novel approach to designing zero-aliasing space compactors utilizing switching theory concepts of Hamming distance, sequence weights, cover table and frequency ordering, together with concept of Nth order missed error probability estimates under stochastic dependence of line errors for detectable single stuck line faults of the CUT. The advantages of aliasing-free space compaction over earlier techniques are evidently clear-zero-aliasing is achieved without any modifications of the CUT, the area overhead and signal propagation delay are relatively less compared to conventional parity tree linear compactors, and the approach used works equally well with both deterministic and pseudorandom test sets.