相变记忆细胞中瞬时结晶和亚稳态模型的比较

A. Faraclas, N. Williams, G. Bakan, A. Gokirmak, H. Silva
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引用次数: 5

摘要

相变存储器(PCM)由于其快速的写入速度和积极扩展的封装密度,是下一代非易失性存储类存储器的可能竞争对手。在PCM电池中,电流被限制在狭窄的导电路径中,以在硫系材料(最常用的是Ge2Sb2Te5或GST)中产生高电流密度。由此产生的热量允许材料在晶体(设定)和非晶(重置)状态之间切换,根据电池尺寸改变电池的电阻~10-104倍。熔化更小的区域所需的能量更少,因此积极的电池缩放导致功率降低和包装密度增加。GST的性质随温度的变化以数量级变化,因此了解其热依赖性对于准确模拟相变存储单元的操作至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Comparison of instantaneous crystallization and metastable models in phase change memory cells
Phase change memory (PCM) is a possible competitor for future generation non-volatile storage class memory due to its fast writing speed and aggressively scaled packing density. In PCM cells current is confined through narrow conductive paths to create high current densities in a chalcogenide material (Ge2Sb2Te5 or GST is most commonly used). The resulting heat allows the material to switch between crystalline (set) and amorphous (reset) states, changing the cell's resistance by ~10-104 times depending on the cell dimensions. Less energy is required for melting smaller regions, therefore aggressive cell scaling results in reduced power and increased packing density. The properties of GST change by orders of magnitude as a function of temperature, and thus understanding its thermal dependency is crucial to accurately model phase change memory cell operation.
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