为紧凑的硬件安全原语设计可靠的基于ram的PUF

Ayushi Shrivastava, Pai-Yu Chen, Yunhui Cao, Shimeng Yu, C. Chakrabarti
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引用次数: 6

摘要

物理不可克隆函数(PUF)必须是高度可靠的,特别是当它与用于生成密钥的加密散列模块一起使用时。为了实现超高的可靠性,传统的方法采用基于辅助数据输入的纠错码(ECC)。这种方法不仅增加了PUF的硬件开销,而且降低了系统的熵,导致硬件和软件安全问题。本文设计了一种基于电阻式随机存取存储器(RRAM)的紧凑、高可靠的PUF结构。我们提出了一种新的设计,其中多个RRAM单元的读出电流之和用于产生一个响应位。这种方法在统计上最大限度地减少了由于高温或电压应力下RRAM保留退化而导致的任何早期寿命失效。我们采用了一个用IMEC HfOx RRAM实验数据校准的器件模型,并表明每比特8个单元,我们可以确保在125°C下使用寿命>10年的99.9999%可靠性。我们将RRAM PUF嵌入到SHA-256中,并表明所提出的基于RRAM PUF的架构的硬件开销明显低于使用带有ECC的传统RRAM PUF的架构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of a reliable RRAM-based PUF for compact hardware security primitives
Physical Unclonable Functions (PUF) have to be highly reliable especially when it is being used along with cryptographic hash modules for key generation. To achieve ultrahigh reliability, the conventional approach employs error correction codes (ECC) based on helper data input. Such an approach not only increases the hardware overhead of the PUF but also reduces the entropy of the system, resulting in both hardware and software security issues. In this paper we design a compact and highly reliable PUF architecture based on resistive random access memory (RRAM). We propose a new design where the sum of the read-out currents of multiple RRAM cells is used for generating one response bit. This method statistically minimizes any early-lifetime failure due to RRAM retention degradation at high temperature or under voltage stress. We employ a device model that is calibrated with IMEC HfOx RRAM experimental data and show that with 8 cells per bit, we can ensure <10-6 Intra-Hamming distance (or >99.9999% reliability) for a lifetime >10 years at 125°C. We embed the RRAM PUF into SHA-256 and show that the hardware overhead of the proposed RRAM PUF based architecture is significantly lower than one that uses a traditional RRAM PUF with ECC.
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