丝键- s - fccsp结构翘曲与应力特性分析

V. Lin, E. Chen, D. Jiang, Yu Po Wang
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引用次数: 4

摘要

随着电子消费产品的发展趋势,对多功能、高性能、小型化、高可靠性和低成本提出了强烈的要求,特别是在便携式手机领域的快速发展。此外,多种功能需求促使先进封装的发展,如片上系统(SoC)和包内系统(SiP)。片上系统(SoC)是在芯片级集成多种功能的理想封装。但由于设计和测试还不成熟,高成本和低成品率,促使多功能集成技术向系统级封装(System-in-Package, SiP)方向发展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Warpage and stress characteristic analyses on wire-bond-S-FCCSP structure
For the trend of electronic consumer product, more functionalities, high performance, miniaturization, high reliability and low cost have been demanded intensely, especially in the rapid growth of portable cell phone domain. Furthermore, multiple functional demand induces advanced package developments, such as System-on-Chip (SoC) and System-in-Package (SiP). System-on-chip (SoC) is an ideal package to integrate multiple functionalities in the chip level. But the design and testing are not yet mature that, high cost and low manufacturing yield, drive multiple functional integration technology toward System-in-Package (SiP) development.
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