CMOS 90 LQFP汽车产品低α绿色化合物开发

Jinmei Liu, Yuan Yuan, Junhua Luo, Jinzhong Yao
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引用次数: 0

摘要

CMOS 90晶圆已应用于BGA(球栅阵列)封装多年。然而,应用于铅封装的并不多。本文介绍了CMOS 90晶圆在LQFP (Low profile Quad Flat Package)中的一种应用。同时,它是汽车应用,需要满足AEC 1级可靠性要求[1]。该封装需要低α绿色化合物来降低SER(软错误率),以实现电稳健性。该包装是64铅LQFP和银是环镀铅尖端。首先,通过截面分析和SEM检查,在TC (Temperature Cycle)后观察到铅尖的分层现象。还尝试了用Ar/H2对模前血浆进行评估,但无法消除分层。然后进行力学模拟,证实应力集中在引线尖端,这对电磁兼容附着力有很大影响。最后,采用高粘附型偶联剂对复合材料进行了优化,提高了复合材料与银的粘附性,成功地去除了铅尖的分层现象。因此,CMOS 90 LQFP封装达到了AEC 1级可靠性要求,并通过了生产资格。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low alpha green compound development for CMOS 90 LQFP automotive product
CMOS 90 wafers had been applied to BGA (Ball Grid Array) packages for many years. However, the application to lead package is not much. This paper introduced one application for CMOS 90 wafers to LQFP (Low profile Quad Flat Package). Simultaneously, it is for automotive application and need meet AEC Grade 1 reliability requirements [1]. Low alpha green compound is required for this package to reduce the SER (soft error rate) for electrical robustness. The package is 64 lead LQFP and silver is ring plated for the lead tips. At the beginning, the lead tip delamination was observed after TC (Temperature Cycle) through cross section analysis and SEM check. Pre mold plasma evaluation with Ar/H2 was also tried, but it couldn't remove the delamination. Then mechanical simulation was performed and confirmed that stresses are focused on the tips of the lead which will greatly affect the EMC adhesion. Finally, the compound was optimized by using the high adhesion type of coupling agent to improve the compound adhesion with silver and the lead tip delamination was successfully removed. As a result, the CMOS 90 LQFP package achieved the AEC Grade 1 reliability requirements and passed qualification for production.
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