脉冲神经网络中CBRAM记忆器件阵列的潜行路径效应

David Roclin, O. Bichler, C. Gamrat, Jacques-Olivier Klein
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引用次数: 7

摘要

本文研究了作为脉冲神经网络突触的CBRAM记忆器件阵列中潜行路径和寄生金属线电阻的影响。综述了交点阵列的三种结构:横杆(1R)、阳极连接矩阵(1T-IR)和阴极连接矩阵(1T-IR)。我们表明,交叉杆是一种能耗结构,在SET/RESET期间具有高泄漏,并且由于沿线路的电压下降而增加了开关时间。此外,我们表明,寄生线电阻会对器件的读电阻产生重大影响,这取决于它们在横杆中的位置。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sneak paths effects in CBRAM memristive devices arrays for spiking neural networks
In this paper, we study the effects of sneak paths and parasitic metal line resistance in arrays of CBRAM memristive devices operating as synapses for spiking neural networks. Three structures of crosspoint array are reviewed: the crossbar (1R), the anode connected matrix (1T-IR) and the cathode connected matrix (1T-IR). We show that the crossbar is an energy-consuming structure with high leakage during SET/RESET and with an increased switching time due to voltage drops along the lines. Furthermore, we show that parasitic line resistance can have a significant impact on the read resistance of the devices, depending on their location in the crossbar.
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