{"title":"GE兆瓦级碳化硅光伏逆变器开发","authors":"R. Zhou","doi":"10.1109/PVSC.2016.7750312","DOIUrl":null,"url":null,"abstract":"Silicon Carbide (SiC) power devices can operate at higher temperatures, higher voltages and higher switching frequencies compared to existing silicon devices, resulting in greater power converter efficiency, smaller size and improved bandwidth. The SiC power device development at GE was launched in 2005 and is now starting transition from pilot production to high volume manufacturing. This talk will highlight GE's ongoing efforts to develop MW class PV inverter with best-in-class CEC efficiency approach 99%. The challenge of using SiC in those power applications is that the emphasis on reliability, ruggedness and cost is significantly higher. The extensive internal and external reliability testing of GE SiC MOSFETs has demonstrated reliability comparable to mature silicon power devices. In addition, extensive stress testing has mapped-out the device's safe operating area, such as: avalanche capability, short circuit ruggedness, body diode stability, and terrestrial cosmic radiation hardness.","PeriodicalId":6524,"journal":{"name":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","volume":"31 1","pages":"3470-3470"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"GE MW SiC PV inverter development\",\"authors\":\"R. Zhou\",\"doi\":\"10.1109/PVSC.2016.7750312\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silicon Carbide (SiC) power devices can operate at higher temperatures, higher voltages and higher switching frequencies compared to existing silicon devices, resulting in greater power converter efficiency, smaller size and improved bandwidth. The SiC power device development at GE was launched in 2005 and is now starting transition from pilot production to high volume manufacturing. This talk will highlight GE's ongoing efforts to develop MW class PV inverter with best-in-class CEC efficiency approach 99%. The challenge of using SiC in those power applications is that the emphasis on reliability, ruggedness and cost is significantly higher. The extensive internal and external reliability testing of GE SiC MOSFETs has demonstrated reliability comparable to mature silicon power devices. In addition, extensive stress testing has mapped-out the device's safe operating area, such as: avalanche capability, short circuit ruggedness, body diode stability, and terrestrial cosmic radiation hardness.\",\"PeriodicalId\":6524,\"journal\":{\"name\":\"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)\",\"volume\":\"31 1\",\"pages\":\"3470-3470\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.2016.7750312\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2016.7750312","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
摘要
与现有的硅器件相比,碳化硅(SiC)功率器件可以在更高的温度、更高的电压和更高的开关频率下工作,从而实现更高的功率转换器效率、更小的尺寸和改进的带宽。通用电气的SiC功率器件开发始于2005年,目前正开始从试点生产向大批量生产过渡。本次演讲将重点介绍GE正在努力开发的兆瓦级光伏逆变器,其CEC效率接近99%。在这些电源应用中使用SiC的挑战在于对可靠性、坚固性和成本的强调要高得多。GE SiC mosfet广泛的内部和外部可靠性测试表明,其可靠性可与成熟的硅功率器件相媲美。此外,广泛的压力测试已经绘制出设备的安全操作区域,例如:雪崩能力,短路坚固性,体二极管稳定性和地面宇宙辐射硬度。
Silicon Carbide (SiC) power devices can operate at higher temperatures, higher voltages and higher switching frequencies compared to existing silicon devices, resulting in greater power converter efficiency, smaller size and improved bandwidth. The SiC power device development at GE was launched in 2005 and is now starting transition from pilot production to high volume manufacturing. This talk will highlight GE's ongoing efforts to develop MW class PV inverter with best-in-class CEC efficiency approach 99%. The challenge of using SiC in those power applications is that the emphasis on reliability, ruggedness and cost is significantly higher. The extensive internal and external reliability testing of GE SiC MOSFETs has demonstrated reliability comparable to mature silicon power devices. In addition, extensive stress testing has mapped-out the device's safe operating area, such as: avalanche capability, short circuit ruggedness, body diode stability, and terrestrial cosmic radiation hardness.