调整损伤模型以优化电子封装结构中的塑性应变分布

Zubin Chen, X. Long
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引用次数: 0

摘要

由于热应力的循环加载,焊点工作在循环疲劳的过程中,整个过程中焊点的失效行为实际上是一个损伤积累的过程。研究焊点在循环载荷作用下的疲劳性能是可行的。为了实现精确的数值模拟,焊料本构模型得到了广泛的关注。将损伤变量与本构模型耦合的方法为实现这一目标提供了有效途径。在热循环加载条件下,材料性能劣化所对应的损伤演化符合热力学的基本原理框架。在此框架下,可以利用连续损伤力学推导出损伤演化模型。该模型通过对材料的微观缺陷进行平均,大大简化了模型,只要所建立的模型及其导出的演化模型能够解决工程问题。基于损伤本构模型的理论框架,完成了适用于ABAQUS有限元软件的UMAT用户材料子程序。通过ABAQUS二次开发界面,不断优化耦合损伤的粘塑性本构模型参数,从而更好地模拟焊料疲劳过程。在研究耦合损伤本构模型的基础上,将UMAT应用于BGA封装结构的计算,进一步体现了该模型对焊料疲劳性能的优化能力,仿真结果与试验结果吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Tuning damage model to optimize the plastic strain distribution in electronic packaging structures
Due to the cyclic loading of thermal stress, the solder joints work in the process of cyclic fatigue, and the failure behavior of solder joints in the whole process is actually a process of damage accumulation. It is feasible to study the fatigue properties of solder joints under cyclic loading. In order to achieve accurate numerical simulations, solder constitutive models have been widely concerned. The method of coupling damage variables with a constitutive model provides an effective way to achieve this goal. Under the condition of thermal cycle loading, the damage evolution corresponding to deteriorate material properties meets the basic principle framework of thermodynamics. In this framework, the damage evolution model can be derived by using continuum damage mechanics. This model is greatly simplified by averaging the micro defects of materials, as long as the established model and its derived evolution model can solve engineering problems. Based on the theoretical framework of damage constitutive model, a UMAT user material subroutine suitable for ABAQUS finite element software is completed. Through the secondary development interface of ABAQUS, the viscoplastic constitutive model parameters of coupling damage are continuously optimized, so as to achieve better simulations of the solder fatigue process. Based on the study of the coupled damage constitutive model, the UMAT is applied to the calculation of BGA packaging structure to further reflect the optimization capacity of the model for solder fatigue performance with simulation results as a good fit to the test results.
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