碳纳米管在超锋利硅纳米尖上的高产接枝:力学表征和原子力显微镜成像

2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS) Pub Date : 2007-01-01 DOI:10.1109/MEMSYS.2007.4433179

A. Rollier, C. Bernard, S. Marsaudon, A. Bonnot, Marc Faucher, J. Aimé, Bernard Legrand, Dominique Collard, L. Buchaillot

{"title":"碳纳米管在超锋利硅纳米尖上的高产接枝:力学表征和原子力显微镜成像","authors":"A. Rollier, C. Bernard, S. Marsaudon, A. Bonnot, Marc Faucher, J. Aimé, Bernard Legrand, Dominique Collard, L. Buchaillot","doi":"10.1109/MEMSYS.2007.4433179","DOIUrl":null,"url":null,"abstract":"The novelty of this work lies in the fabrication of nanotips without any facet allowing the high yield of robust carbon nanotube (CNT) grafting for atomic force microscopy (AFM) experiments.","PeriodicalId":6388,"journal":{"name":"2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)","volume":"61 1","pages":"851-854"},"PeriodicalIF":0.0000,"publicationDate":"2007-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High yield grafting of carbon nanotube on ultra-sharp silicon nanotips: Mechanical characterization and AFM imaging\",\"authors\":\"A. Rollier, C. Bernard, S. Marsaudon, A. Bonnot, Marc Faucher, J. Aimé, Bernard Legrand, Dominique Collard, L. Buchaillot\",\"doi\":\"10.1109/MEMSYS.2007.4433179\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The novelty of this work lies in the fabrication of nanotips without any facet allowing the high yield of robust carbon nanotube (CNT) grafting for atomic force microscopy (AFM) experiments.\",\"PeriodicalId\":6388,\"journal\":{\"name\":\"2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)\",\"volume\":\"61 1\",\"pages\":\"851-854\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEMSYS.2007.4433179\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSYS.2007.4433179","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

这项工作的新颖之处在于制造了没有任何表面的纳米尖端，从而使得原子力显微镜(AFM)实验中健壮的碳纳米管(CNT)接枝率高。

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High yield grafting of carbon nanotube on ultra-sharp silicon nanotips: Mechanical characterization and AFM imaging

The novelty of this work lies in the fabrication of nanotips without any facet allowing the high yield of robust carbon nanotube (CNT) grafting for atomic force microscopy (AFM) experiments.

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2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)

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