用于SET缓解的条件软边触发器

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2016-07-04 DOI:10.1109/IOLTS.2016.7604708

Panagiotis Sismanoglou, D. Nikolos

{"title":"用于SET缓解的条件软边触发器","authors":"Panagiotis Sismanoglou, D. Nikolos","doi":"10.1109/IOLTS.2016.7604708","DOIUrl":null,"url":null,"abstract":"Single event transient (SET) pulses are a significant cause of soft errors in a circuit. To cope with SET pulses, we propose a new storage cell that is able to operate either as a hard-edge or soft-edge flip-flop depending on the appearance or not of a transition in a time window. The efficiency of the proposed design with respect to the reduction of soft-errors coming from SET pulses was shown with extensive simulations.","PeriodicalId":6580,"journal":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"29 1","pages":"227-232"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Conditional soft-edge flip-flop for SET mitigation\",\"authors\":\"Panagiotis Sismanoglou, D. Nikolos\",\"doi\":\"10.1109/IOLTS.2016.7604708\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single event transient (SET) pulses are a significant cause of soft errors in a circuit. To cope with SET pulses, we propose a new storage cell that is able to operate either as a hard-edge or soft-edge flip-flop depending on the appearance or not of a transition in a time window. The efficiency of the proposed design with respect to the reduction of soft-errors coming from SET pulses was shown with extensive simulations.\",\"PeriodicalId\":6580,\"journal\":{\"name\":\"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)\",\"volume\":\"29 1\",\"pages\":\"227-232\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2016.7604708\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2016.7604708","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

单事件瞬态(SET)脉冲是导致电路软误差的重要原因。为了应对SET脉冲，我们提出了一种新的存储单元，它能够根据时间窗口中过渡的出现或不出现而作为硬边或软边触发器运行。大量的仿真结果表明，该设计在减小SET脉冲产生的软误差方面是有效的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Conditional soft-edge flip-flop for SET mitigation

Single event transient (SET) pulses are a significant cause of soft errors in a circuit. To cope with SET pulses, we propose a new storage cell that is able to operate either as a hard-edge or soft-edge flip-flop depending on the appearance or not of a transition in a time window. The efficiency of the proposed design with respect to the reduction of soft-errors coming from SET pulses was shown with extensive simulations.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)

自引率

0.00%

发文量