{"title":"射频GaN器件模型综述及模型参数提取流程","authors":"Raj Sodhi, R. Tinti, M. Dunn, Ma Long","doi":"10.1109/ICSICT49897.2020.9278132","DOIUrl":null,"url":null,"abstract":"GaN (Gallium-Nitride) devices continue to advance in market acceptance for 5G, radar, and power electronics due to their high-power handling capability and linearity. GaN technology outperforms other RF technologies because it can simultaneously offer the highest power, gain, and efficiency combination at a given frequency. We will review market trends, technology and challenges in using these devices. In 2018, two new physics-based GaN models were accepted as industry standard amid a backdrop of other models. To address the growing need for accurate RF GaN models, new model parameter extraction flows are presented within the IC-CAP software framework, leveraging DC-IV, capacitance and S-parameter data.","PeriodicalId":6727,"journal":{"name":"2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)","volume":"1 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"RF GaN Device Model Survey and Model Parameter Extraction Flows\",\"authors\":\"Raj Sodhi, R. Tinti, M. Dunn, Ma Long\",\"doi\":\"10.1109/ICSICT49897.2020.9278132\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"GaN (Gallium-Nitride) devices continue to advance in market acceptance for 5G, radar, and power electronics due to their high-power handling capability and linearity. GaN technology outperforms other RF technologies because it can simultaneously offer the highest power, gain, and efficiency combination at a given frequency. We will review market trends, technology and challenges in using these devices. In 2018, two new physics-based GaN models were accepted as industry standard amid a backdrop of other models. To address the growing need for accurate RF GaN models, new model parameter extraction flows are presented within the IC-CAP software framework, leveraging DC-IV, capacitance and S-parameter data.\",\"PeriodicalId\":6727,\"journal\":{\"name\":\"2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)\",\"volume\":\"1 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSICT49897.2020.9278132\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSICT49897.2020.9278132","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
RF GaN Device Model Survey and Model Parameter Extraction Flows
GaN (Gallium-Nitride) devices continue to advance in market acceptance for 5G, radar, and power electronics due to their high-power handling capability and linearity. GaN technology outperforms other RF technologies because it can simultaneously offer the highest power, gain, and efficiency combination at a given frequency. We will review market trends, technology and challenges in using these devices. In 2018, two new physics-based GaN models were accepted as industry standard amid a backdrop of other models. To address the growing need for accurate RF GaN models, new model parameter extraction flows are presented within the IC-CAP software framework, leveraging DC-IV, capacitance and S-parameter data.