{"title":"ITO/Al/sub 2/O/sub 3/超晶格隧道二极管的强高效发光","authors":"A. Chin, C. Liang, C. Lin, C.C. Wu, J. Liu","doi":"10.1109/IEDM.2001.979459","DOIUrl":null,"url":null,"abstract":"We have studied the electroluminescence of ITO/Al/sub 2/O/sub 3/ superlattice tunnel diode on Si. The light emission intensity and efficiency are >3 orders of magnitude larger than 20 /spl Aring/ SiO/sub 2/ tunnel diode and 0.18 /spl mu/m MOSFET. Besides the small 3 V operation and low power consumption, good reliability is another merit for this device.","PeriodicalId":13825,"journal":{"name":"International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)","volume":"13 1","pages":"8.3.1-8.3.4"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Strong and efficient light emission in ITO/Al/sub 2/O/sub 3/ superlattice tunnel diode\",\"authors\":\"A. Chin, C. Liang, C. Lin, C.C. Wu, J. Liu\",\"doi\":\"10.1109/IEDM.2001.979459\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have studied the electroluminescence of ITO/Al/sub 2/O/sub 3/ superlattice tunnel diode on Si. The light emission intensity and efficiency are >3 orders of magnitude larger than 20 /spl Aring/ SiO/sub 2/ tunnel diode and 0.18 /spl mu/m MOSFET. Besides the small 3 V operation and low power consumption, good reliability is another merit for this device.\",\"PeriodicalId\":13825,\"journal\":{\"name\":\"International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)\",\"volume\":\"13 1\",\"pages\":\"8.3.1-8.3.4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-12-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2001.979459\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2001.979459","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Strong and efficient light emission in ITO/Al/sub 2/O/sub 3/ superlattice tunnel diode
We have studied the electroluminescence of ITO/Al/sub 2/O/sub 3/ superlattice tunnel diode on Si. The light emission intensity and efficiency are >3 orders of magnitude larger than 20 /spl Aring/ SiO/sub 2/ tunnel diode and 0.18 /spl mu/m MOSFET. Besides the small 3 V operation and low power consumption, good reliability is another merit for this device.