{"title":"微波信号在一些左旋结构中的传播研究","authors":"M. Banciu, A. Ioachim, N. Militaru, G. Lojewski","doi":"10.1109/SMICND.2008.4703340","DOIUrl":null,"url":null,"abstract":"Some aspects of microwave propagation through left-handed materials are investigated in this paper. The strong distortion of a Gaussian TEM pulse through a material with negative refraction index is studied in the time domain. Moreover, a method of extracting the constitutive parameters of a material by using the scattering parameters of a sample two-port is developed. This method is then applied to some left-handed microstrip structures.","PeriodicalId":6406,"journal":{"name":"2008 IEEE International Conference on Semiconductor Electronics","volume":"344 1","pages":"107-110"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Investigation on microwave signal propagation through some left-handed structures\",\"authors\":\"M. Banciu, A. Ioachim, N. Militaru, G. Lojewski\",\"doi\":\"10.1109/SMICND.2008.4703340\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Some aspects of microwave propagation through left-handed materials are investigated in this paper. The strong distortion of a Gaussian TEM pulse through a material with negative refraction index is studied in the time domain. Moreover, a method of extracting the constitutive parameters of a material by using the scattering parameters of a sample two-port is developed. This method is then applied to some left-handed microstrip structures.\",\"PeriodicalId\":6406,\"journal\":{\"name\":\"2008 IEEE International Conference on Semiconductor Electronics\",\"volume\":\"344 1\",\"pages\":\"107-110\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Conference on Semiconductor Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.2008.4703340\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Conference on Semiconductor Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2008.4703340","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation on microwave signal propagation through some left-handed structures
Some aspects of microwave propagation through left-handed materials are investigated in this paper. The strong distortion of a Gaussian TEM pulse through a material with negative refraction index is studied in the time domain. Moreover, a method of extracting the constitutive parameters of a material by using the scattering parameters of a sample two-port is developed. This method is then applied to some left-handed microstrip structures.
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