利用金纳米结构的纳米等离子体传感

A. Thajeel, M. Ibrahem, D. Ahmed
{"title":"利用金纳米结构的纳米等离子体传感","authors":"A. Thajeel, M. Ibrahem, D. Ahmed","doi":"10.53293/jasn.2021.4282.1087","DOIUrl":null,"url":null,"abstract":"Nanoplasmonic sensing, based on the plasmonic resonance absorption of thin, irregularly-shaped Au nanostructures film, with a starting thickness of about 15 nm (±3 nm) sputtered on a quartz substrate, is used to monitor the CeO 2 NPs (with an average diameter of 50 nm) film refractive index variations using different film thicknesses (90 nm, 146 nm, 172 nm, and 196 nm). Increasing the film thickness of solution-processed CeO 2 NPs film, with layer-by-layer deposition on top of Au nanostructures, shows a significant redshift in the plasmonic resonance absorption of the plasmonic metal, from 580 nm to 611 nm. Such an increase is related to the change in the building microstructure of the semiconductor’s film which is reflected in changing its refractive index. Plasmonic surface refractive index sensitivity of 437.5 nm/RIU with FOM of 4.2 has been recorded. Such a sensing technique offers a large potential for developing cost-effective plasmonic nanosensing devices for clinical applications. This sensor structure is versatile and can be utilized to sense and monitor a large variety of materials and chemicals. 2 ± Surface is using free AFM 2","PeriodicalId":15241,"journal":{"name":"Journal of Applied Sciences and Nanotechnology","volume":"253 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Nanoplasmonic Sensing Using Gold Nanostructures\",\"authors\":\"A. Thajeel, M. Ibrahem, D. Ahmed\",\"doi\":\"10.53293/jasn.2021.4282.1087\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Nanoplasmonic sensing, based on the plasmonic resonance absorption of thin, irregularly-shaped Au nanostructures film, with a starting thickness of about 15 nm (±3 nm) sputtered on a quartz substrate, is used to monitor the CeO 2 NPs (with an average diameter of 50 nm) film refractive index variations using different film thicknesses (90 nm, 146 nm, 172 nm, and 196 nm). Increasing the film thickness of solution-processed CeO 2 NPs film, with layer-by-layer deposition on top of Au nanostructures, shows a significant redshift in the plasmonic resonance absorption of the plasmonic metal, from 580 nm to 611 nm. Such an increase is related to the change in the building microstructure of the semiconductor’s film which is reflected in changing its refractive index. Plasmonic surface refractive index sensitivity of 437.5 nm/RIU with FOM of 4.2 has been recorded. Such a sensing technique offers a large potential for developing cost-effective plasmonic nanosensing devices for clinical applications. This sensor structure is versatile and can be utilized to sense and monitor a large variety of materials and chemicals. 2 ± Surface is using free AFM 2\",\"PeriodicalId\":15241,\"journal\":{\"name\":\"Journal of Applied Sciences and Nanotechnology\",\"volume\":\"253 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Applied Sciences and Nanotechnology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.53293/jasn.2021.4282.1087\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Sciences and Nanotechnology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.53293/jasn.2021.4282.1087","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

采用纳米等离子体传感技术,对初始厚度约为15 nm(±3 nm)的不规则形状Au纳米结构薄膜在石英衬底上溅射产生的等离子体共振吸收,监测了不同厚度(90 nm、146 nm、172 nm和196 nm)的ceo2 NPs(平均直径为50 nm)薄膜折射率的变化。增加溶液法制备的ceo2 NPs薄膜的厚度,在Au纳米结构上逐层沉积,等离子体金属的等离子共振吸收出现了明显的红移,从580 nm到611 nm。这种增加与半导体薄膜的建筑微观结构的变化有关,这种变化反映在其折射率的变化上。等离子体表面折射率灵敏度为437.5 nm/RIU, FOM为4.2。这种传感技术为开发具有成本效益的等离子体纳米传感设备提供了巨大的潜力。这种传感器结构是通用的,可以用来感测和监测各种各样的材料和化学品。2±表面使用自由AFM 2
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nanoplasmonic Sensing Using Gold Nanostructures
Nanoplasmonic sensing, based on the plasmonic resonance absorption of thin, irregularly-shaped Au nanostructures film, with a starting thickness of about 15 nm (±3 nm) sputtered on a quartz substrate, is used to monitor the CeO 2 NPs (with an average diameter of 50 nm) film refractive index variations using different film thicknesses (90 nm, 146 nm, 172 nm, and 196 nm). Increasing the film thickness of solution-processed CeO 2 NPs film, with layer-by-layer deposition on top of Au nanostructures, shows a significant redshift in the plasmonic resonance absorption of the plasmonic metal, from 580 nm to 611 nm. Such an increase is related to the change in the building microstructure of the semiconductor’s film which is reflected in changing its refractive index. Plasmonic surface refractive index sensitivity of 437.5 nm/RIU with FOM of 4.2 has been recorded. Such a sensing technique offers a large potential for developing cost-effective plasmonic nanosensing devices for clinical applications. This sensor structure is versatile and can be utilized to sense and monitor a large variety of materials and chemicals. 2 ± Surface is using free AFM 2
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