差分触发器设计的单事件性能及其加固意义

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2016-07-04 DOI:10.1109/IOLTS.2016.7604707

R. M. Chen, E. Zhang, B. Bhuva

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引用次数: 0

摘要

采用电路级仿真对高速操作的差分触发器设计进行了单事件(SE)效应评估。结果显示了一些差分触发器设计的SE性能与输入相关。讨论了所有差分触发器的布局优化和SSTC的电路设计的辐射硬化。

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Single-event performance of differential flip-flop designs and hardening implication

Differential flip-flop designs for high-speed operations are evaluated for single-event (SE) effects using circuit-level simulations. Results show input dependent SE performance of some differential flip-flop designs. Radiation hardenings by layout optimization for all differential flip-flops and by circuit design for SSTC are discussed.

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2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)

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