将模型开发与特性描述相结合

International Electron Devices Meeting 1991 [Technical Digest] Pub Date : 1991-12-08 DOI:10.1109/IEDM.1991.235260

D. Scharfetter, S. Duvall

{"title":"将模型开发与特性描述相结合","authors":"D. Scharfetter, S. Duvall","doi":"10.1109/IEDM.1991.235260","DOIUrl":null,"url":null,"abstract":"The authors demonstrate the advantages of combining model characterization with model development and implementation. Examples cover process and device simulators, compact models for circuit simulators, and statistical models for design verification of IC devices. Situations in which combining model characterization with design could have avoided miscorrelations identified during design verification are discussed.<<ETX>>","PeriodicalId":13885,"journal":{"name":"International Electron Devices Meeting 1991 [Technical Digest]","volume":"153 1","pages":"976-977"},"PeriodicalIF":0.0000,"publicationDate":"1991-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Combining model development with characterization\",\"authors\":\"D. Scharfetter, S. Duvall\",\"doi\":\"10.1109/IEDM.1991.235260\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors demonstrate the advantages of combining model characterization with model development and implementation. Examples cover process and device simulators, compact models for circuit simulators, and statistical models for design verification of IC devices. Situations in which combining model characterization with design could have avoided miscorrelations identified during design verification are discussed.<<ETX>>\",\"PeriodicalId\":13885,\"journal\":{\"name\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"volume\":\"153 1\",\"pages\":\"976-977\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1991.235260\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Electron Devices Meeting 1991 [Technical Digest]","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1991.235260","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

作者论证了将模型表征与模型开发和实现相结合的优点。示例包括过程和设备模拟器，电路模拟器的紧凑模型，以及IC设备设计验证的统计模型。讨论了将模型表征与设计相结合可以避免在设计验证期间确定的不相关的情况

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Combining model development with characterization

The authors demonstrate the advantages of combining model characterization with model development and implementation. Examples cover process and device simulators, compact models for circuit simulators, and statistical models for design verification of IC devices. Situations in which combining model characterization with design could have avoided miscorrelations identified during design verification are discussed.<>

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

International Electron Devices Meeting 1991 [Technical Digest]

自引率

0.00%

发文量