{"title":"基于fpga的通用嵌入式数字仪表","authors":"J. Ferry","doi":"10.1109/TEST.2013.6651917","DOIUrl":null,"url":null,"abstract":"In order to test products, a multi-purpose digital instrument has been developed which can be completely embedded within on-board FPGAs. This instrument incorporates numerous features such as specialized triggering, fault capture, and pattern edge placement. To increase usability, pattern generation and protocol-aware features are included within its small footprint. The applications of the embedded instrument can include design verification, production test, and fault diagnostics in a simple and low resource implementation.","PeriodicalId":6379,"journal":{"name":"2013 IEEE International Test Conference (ITC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"FPGA-based universal embedded digital instrument\",\"authors\":\"J. Ferry\",\"doi\":\"10.1109/TEST.2013.6651917\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to test products, a multi-purpose digital instrument has been developed which can be completely embedded within on-board FPGAs. This instrument incorporates numerous features such as specialized triggering, fault capture, and pattern edge placement. To increase usability, pattern generation and protocol-aware features are included within its small footprint. The applications of the embedded instrument can include design verification, production test, and fault diagnostics in a simple and low resource implementation.\",\"PeriodicalId\":6379,\"journal\":{\"name\":\"2013 IEEE International Test Conference (ITC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Test Conference (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2013.6651917\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2013.6651917","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In order to test products, a multi-purpose digital instrument has been developed which can be completely embedded within on-board FPGAs. This instrument incorporates numerous features such as specialized triggering, fault capture, and pattern edge placement. To increase usability, pattern generation and protocol-aware features are included within its small footprint. The applications of the embedded instrument can include design verification, production test, and fault diagnostics in a simple and low resource implementation.