大电流z夹头解体及周边设备保护问题

V. I. Zaĭtsev, Yu. V. Andryanov, G. Volkov, Ye. V. Grabovsky, N. I. Lakhtyushko, A. Kartashov
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引用次数: 3

摘要

考虑了电流终止时的z捏缩衰减过程。讨论了在Angara-5-1装置上获得的多丝钨衬垫压缩实验数据。结果表明,在腐蚀产物中存在侵蚀后的衬砌材料微粒和等离子体通量。结果表明,等离子体的流动速度超过了z箍缩等离子体的“热”速度。提出了一种基于双极性机理的离子加速过程描述模型。讨论了外围设备对z箍缩衰减产物的防护措施,并对防护元件进行了研究。一个快速电磁百叶窗用于防止微粒。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-current Z-pinch disintegration and the problem of peripheral equipment protection
The process of Z-pinch decay upon current termination is considered. The experimental data obtained for the Angara-5-1 facility on compression of multiwire tungsten liners are discussed. It is shown that among the decay products there are microparticles of the eroded liner construction material and plasma fluxes. It was determined that the plasma flow velocities exceeded the ‘thermal’ velocities of the Z-pinch plasma. A model for the description of the process of ion acceleration based on an ambipolar mechanism is suggested. Precautions for protection of the peripheral equipment against the decay products of Z-pinch are discussed and protective components are studied. A fast electromagnetic shutter is used for protection from microparticles.
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来源期刊
Plasma Devices and Operations
Plasma Devices and Operations 物理-核科学技术
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