G. B. Brandão, L. D. de Almeida, A. Deep, A. Lima, H. Neff
{"title":"热阻式微传感器的不稳定性和热失控动力学","authors":"G. B. Brandão, L. D. de Almeida, A. Deep, A. Lima, H. Neff","doi":"10.1109/IMTC.2001.929450","DOIUrl":null,"url":null,"abstract":"Under specific biasing conditions the characteristics of thermoresistive sensors become nonlinear. A significant feature is the appearance of thermal runaway. In this paper, the conditions of appearance and the dynamics of this phenomenon have been evaluated by simulations and by experiments. The origin of thermal instability is electrothermal feedback and results from sensor biasing. Under the condition of negative electrothermal feedback the sensor response is faster, while for destructive positive feedback, response times and sensor temperature increase to large values that exceed the range of practical use.","PeriodicalId":68878,"journal":{"name":"Journal of Measurement Science and Instrumentation","volume":"3 1","pages":"1467-1472 vol.3"},"PeriodicalIF":0.0000,"publicationDate":"2001-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Instability and dynamics of thermal runaway of thermoresistive microsensors\",\"authors\":\"G. B. Brandão, L. D. de Almeida, A. Deep, A. Lima, H. Neff\",\"doi\":\"10.1109/IMTC.2001.929450\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Under specific biasing conditions the characteristics of thermoresistive sensors become nonlinear. A significant feature is the appearance of thermal runaway. In this paper, the conditions of appearance and the dynamics of this phenomenon have been evaluated by simulations and by experiments. The origin of thermal instability is electrothermal feedback and results from sensor biasing. Under the condition of negative electrothermal feedback the sensor response is faster, while for destructive positive feedback, response times and sensor temperature increase to large values that exceed the range of practical use.\",\"PeriodicalId\":68878,\"journal\":{\"name\":\"Journal of Measurement Science and Instrumentation\",\"volume\":\"3 1\",\"pages\":\"1467-1472 vol.3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Measurement Science and Instrumentation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2001.929450\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Measurement Science and Instrumentation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2001.929450","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Instability and dynamics of thermal runaway of thermoresistive microsensors
Under specific biasing conditions the characteristics of thermoresistive sensors become nonlinear. A significant feature is the appearance of thermal runaway. In this paper, the conditions of appearance and the dynamics of this phenomenon have been evaluated by simulations and by experiments. The origin of thermal instability is electrothermal feedback and results from sensor biasing. Under the condition of negative electrothermal feedback the sensor response is faster, while for destructive positive feedback, response times and sensor temperature increase to large values that exceed the range of practical use.