S. Wuu, H. Chien, D. Yaung, C. Tseng, C.S. Wang, Chin-Kung Chang, Yunchi Hsaio
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引用次数: 54
摘要
一种高性能的0.18 um CMOS图像传感器技术已被成功开发并充分表征。提出了采用非硅化源漏工艺的3T有源像素传感器(APS),以减小暗电流,提高光响应。通过适当的热循环优化光电二极管结型,可以大大降低暗电流。2.8um/spl sim/4.0um像素间距小,暗电流低(小于0.2 fA/像素),灵敏度高,动态范围广。特别是,优越的暗信号标准偏差8.3 mV/秒,将提供低白像素技术。本文还报道了微透镜的彩色像素性能。
A high performance active pixel sensor with 0.18um CMOS color imager technology
A high performance 0.18 um CMOS image sensor technology has been successfully developed and fully characterized. 3T active pixel sensor (APS) with non-silicide source/drain process is provided to reduce dark current and increase photoresponse. By optimizing photodiode junction profile with the appropriate thermal cycle, the dark current can be drastically reduced. Small pixel pitch 2.8um/spl sim/4.0um demonstrates the low dark current (less 0.2 fA/pixel), the excellent sensitivity and dynamic range. Especially, the superior standard deviation of dark signal 8.3 mV/sec, will offer a low white pixel technology. The color pixel performance with microlens is also reported in this paper.