L. A. Knauss, J. Horwitz, J. Pond, D. Knies, K. Grabowski, D. Chrisey, C. Mueller
{"title":"用脉冲激光沉积法制备大面积SrTiO/ sub3 /有源微波薄膜","authors":"L. A. Knauss, J. Horwitz, J. Pond, D. Knies, K. Grabowski, D. Chrisey, C. Mueller","doi":"10.1109/ISAF.1996.598152","DOIUrl":null,"url":null,"abstract":"Thin films of SrTiO/sub 3/ have been grown by pulsed laser deposition (PLD) on 2\" diameter LaAlO/sub 3/ substrates using a technique in which the laser beam is rastered over the radius of a 4 inch diameter target while the substrate is rotated in a radiative blackbody heater. The deposition occurs through a pie shaped opening in the heater. The structure, composition and thickness have been measured using XRD and RBS. The dielectric properties of the film have been measured at 1 MHz utilizing an LCR meter. The results indicate that the films are single phase and [001] oriented. However, film composition, thickness and dielectric properties are not uniform along the radius of the film. The results indicate that the composition nonuniformity is due to off-axis deposition, and correlates with changes in the dielectric properties.","PeriodicalId":14772,"journal":{"name":"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics","volume":"52 1","pages":"829-832 vol.2"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Large area SrTiO/sub 3/ thin films for active microwave applications grown by pulsed laser deposition\",\"authors\":\"L. A. Knauss, J. Horwitz, J. Pond, D. Knies, K. Grabowski, D. Chrisey, C. Mueller\",\"doi\":\"10.1109/ISAF.1996.598152\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thin films of SrTiO/sub 3/ have been grown by pulsed laser deposition (PLD) on 2\\\" diameter LaAlO/sub 3/ substrates using a technique in which the laser beam is rastered over the radius of a 4 inch diameter target while the substrate is rotated in a radiative blackbody heater. The deposition occurs through a pie shaped opening in the heater. The structure, composition and thickness have been measured using XRD and RBS. The dielectric properties of the film have been measured at 1 MHz utilizing an LCR meter. The results indicate that the films are single phase and [001] oriented. However, film composition, thickness and dielectric properties are not uniform along the radius of the film. The results indicate that the composition nonuniformity is due to off-axis deposition, and correlates with changes in the dielectric properties.\",\"PeriodicalId\":14772,\"journal\":{\"name\":\"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics\",\"volume\":\"52 1\",\"pages\":\"829-832 vol.2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-08-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.1996.598152\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.1996.598152","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Large area SrTiO/sub 3/ thin films for active microwave applications grown by pulsed laser deposition
Thin films of SrTiO/sub 3/ have been grown by pulsed laser deposition (PLD) on 2" diameter LaAlO/sub 3/ substrates using a technique in which the laser beam is rastered over the radius of a 4 inch diameter target while the substrate is rotated in a radiative blackbody heater. The deposition occurs through a pie shaped opening in the heater. The structure, composition and thickness have been measured using XRD and RBS. The dielectric properties of the film have been measured at 1 MHz utilizing an LCR meter. The results indicate that the films are single phase and [001] oriented. However, film composition, thickness and dielectric properties are not uniform along the radius of the film. The results indicate that the composition nonuniformity is due to off-axis deposition, and correlates with changes in the dielectric properties.