Saeideh Sheikhpur, Mahdi Taheri, Mohammad Saeed Ansari, Ali Mahani
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Strengthened 32-bit AES implementation: Architectural error correction configuration with a new voting scheme
Digital data transmission is day by day more vulnerable to both malicious and natural faults. With an aim to assure reliability, security and privacy in communication, a low-cost fault resilient architecture for Advanced Encryption Standard (AES) is proposed. In order not to degrade the reliability of our AES architecture, the reliability of voter is very important, for which reason we have introduced a novel voting scheme include a majority voter (named TMR voter) and an error barrier element (named DMR voter). In this paper, a reliable and secure 32-bit data-path AES implementation based on our robust fault resilient approach is developed. We illustrate that the proposed architecture can tolerate up to triple-bit (byte) simultaneous faults at each pipeline stage’s logic and verify our claim through extensive error simulations. Error simulation results also show that our architecture achieves close to 100% fault-masking capability for multiple-bit (byte) faults. Finally, it is shown that the Application-Specific Integrated Circuit implementation of the fault-tolerant architectures using the composite field-based S-box, CFB-AES, and ROM-based S-box, RB-AES allows better area usage, throughput and fault resilience trade-off compared to their counterparts. So, it provides the most appropriate features to be used in highly-secure resource-constraint applications.
期刊介绍:
IET Computers & Digital Techniques publishes technical papers describing recent research and development work in all aspects of digital system-on-chip design and test of electronic and embedded systems, including the development of design automation tools (methodologies, algorithms and architectures). Papers based on the problems associated with the scaling down of CMOS technology are particularly welcome. It is aimed at researchers, engineers and educators in the fields of computer and digital systems design and test.
The key subject areas of interest are:
Design Methods and Tools: CAD/EDA tools, hardware description languages, high-level and architectural synthesis, hardware/software co-design, platform-based design, 3D stacking and circuit design, system on-chip architectures and IP cores, embedded systems, logic synthesis, low-power design and power optimisation.
Simulation, Test and Validation: electrical and timing simulation, simulation based verification, hardware/software co-simulation and validation, mixed-domain technology modelling and simulation, post-silicon validation, power analysis and estimation, interconnect modelling and signal integrity analysis, hardware trust and security, design-for-testability, embedded core testing, system-on-chip testing, on-line testing, automatic test generation and delay testing, low-power testing, reliability, fault modelling and fault tolerance.
Processor and System Architectures: many-core systems, general-purpose and application specific processors, computational arithmetic for DSP applications, arithmetic and logic units, cache memories, memory management, co-processors and accelerators, systems and networks on chip, embedded cores, platforms, multiprocessors, distributed systems, communication protocols and low-power issues.
Configurable Computing: embedded cores, FPGAs, rapid prototyping, adaptive computing, evolvable and statically and dynamically reconfigurable and reprogrammable systems, reconfigurable hardware.
Design for variability, power and aging: design methods for variability, power and aging aware design, memories, FPGAs, IP components, 3D stacking, energy harvesting.
Case Studies: emerging applications, applications in industrial designs, and design frameworks.