基于同构消去的片上网络启发式映射NoC优化算法

IF 1.1 4区 计算机科学 Q4 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Weng Xiaodong, Liu Yi, Yang Yintang
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引用次数: 2

摘要

随着片上网络理论的发展,人们提出了许多映射算法来解决应用映射问题,这是一个NP难(非多项式难)问题。大多数算法都是基于启发式算法。由于映射序列的同构性,它们被迭代限制,而不是被迭代之间的距离所限制。在这项研究中,作者定义和分析同构的遗传算法(GA),这是一个启发式算法。然后,他们提出了一种称为密度方向变换算法的方法来消除映射序列的同构性,加速种群的收敛。为了验证这种方法,他们开发了一种基于密度方向的遗传映射算法(DDGMAP),并与遗传映射算法进行了比较。实验表明,与随机算法相比,它们的算法(DDGMAP)平均可以实现23.48%的延迟减少和7.15%的功耗减少。DDGMAP在搜索最优解方面比GA具有更好的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Network-on-chip heuristic mapping algorithm based on isomorphism elimination for NoC optimisation

Network-on-chip heuristic mapping algorithm based on isomorphism elimination for NoC optimisation

With the development of network-on-chip (NoC) theory, lots of mapping algorithm have been proposed to solve the application mapping problem which is an NP-hard (non-polynomial hard) problem. Most algorithms are based on a heuristic algorithm. They are trapped by iterations limited, not by the distance between iterations, because of the isomorphism of mapping sequence. In this study, the authors define and analyse the isomorphism with the genetic algorithm (GA) which is a heuristic algorithm. Then, they proposed an approach called density direction transform algorithm to eliminate the isomorphism of mapping sequence and accelerate the convergence of population. To verify this approach, they developed a density-direction-based genetic mapping algorithm (DDGMAP) and make a comparison with genetic mapping algorithm (GMA). The experiment demonstrates that compared to the random algorithm, their algorithm (DDGMAP) can achieve on an average 23.48% delay reduction and 7.15% power reduction. And DDGMAP gets better performance than GA in searching the optimal solution.

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来源期刊
IET Computers and Digital Techniques
IET Computers and Digital Techniques 工程技术-计算机:理论方法
CiteScore
3.50
自引率
0.00%
发文量
12
审稿时长
>12 weeks
期刊介绍: IET Computers & Digital Techniques publishes technical papers describing recent research and development work in all aspects of digital system-on-chip design and test of electronic and embedded systems, including the development of design automation tools (methodologies, algorithms and architectures). Papers based on the problems associated with the scaling down of CMOS technology are particularly welcome. It is aimed at researchers, engineers and educators in the fields of computer and digital systems design and test. The key subject areas of interest are: Design Methods and Tools: CAD/EDA tools, hardware description languages, high-level and architectural synthesis, hardware/software co-design, platform-based design, 3D stacking and circuit design, system on-chip architectures and IP cores, embedded systems, logic synthesis, low-power design and power optimisation. Simulation, Test and Validation: electrical and timing simulation, simulation based verification, hardware/software co-simulation and validation, mixed-domain technology modelling and simulation, post-silicon validation, power analysis and estimation, interconnect modelling and signal integrity analysis, hardware trust and security, design-for-testability, embedded core testing, system-on-chip testing, on-line testing, automatic test generation and delay testing, low-power testing, reliability, fault modelling and fault tolerance. Processor and System Architectures: many-core systems, general-purpose and application specific processors, computational arithmetic for DSP applications, arithmetic and logic units, cache memories, memory management, co-processors and accelerators, systems and networks on chip, embedded cores, platforms, multiprocessors, distributed systems, communication protocols and low-power issues. Configurable Computing: embedded cores, FPGAs, rapid prototyping, adaptive computing, evolvable and statically and dynamically reconfigurable and reprogrammable systems, reconfigurable hardware. Design for variability, power and aging: design methods for variability, power and aging aware design, memories, FPGAs, IP components, 3D stacking, energy harvesting. Case Studies: emerging applications, applications in industrial designs, and design frameworks.
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