铁氧体厚膜层的共振移位

Q3 Engineering

Serbian Journal of Electrical Engineering Pub Date : 2018-01-01 DOI:10.2298/SJEE1803275R

M. K. Rendale, S. Mathad, V. Puri

{"title":"铁氧体厚膜层的共振移位","authors":"M. K. Rendale, S. Mathad, V. Puri","doi":"10.2298/SJEE1803275R","DOIUrl":null,"url":null,"abstract":"Fritless thick films of Ni-Co-Zn ferrites were fabricated by screen printing technique on alumina substrates. Structural analysis was undertaken using X-ray diffraction and Scanning electron microscopy techniques. A new approach for the determination of complex permittivity (   and   ) using microwave property perturbation is unveiled. Ag thick film microstrip ring resonator (MSRR) with and without the thick film substrate was used for the microwave transmission studies in the frequency region of 812 GHz. The microwave conductivity of the thick films lies in the range of 1.779 S/cm to 2.296 S/cm. The penetration depth is also reported within the X-band of microwave frequencies.","PeriodicalId":37704,"journal":{"name":"Serbian Journal of Electrical Engineering","volume":"15 1","pages":"275-284"},"PeriodicalIF":0.0000,"publicationDate":"2018-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Resonance shifting by ferrite thick film superstrate\",\"authors\":\"M. K. Rendale, S. Mathad, V. Puri\",\"doi\":\"10.2298/SJEE1803275R\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fritless thick films of Ni-Co-Zn ferrites were fabricated by screen printing technique on alumina substrates. Structural analysis was undertaken using X-ray diffraction and Scanning electron microscopy techniques. A new approach for the determination of complex permittivity (   and   ) using microwave property perturbation is unveiled. Ag thick film microstrip ring resonator (MSRR) with and without the thick film substrate was used for the microwave transmission studies in the frequency region of 812 GHz. The microwave conductivity of the thick films lies in the range of 1.779 S/cm to 2.296 S/cm. The penetration depth is also reported within the X-band of microwave frequencies.\",\"PeriodicalId\":37704,\"journal\":{\"name\":\"Serbian Journal of Electrical Engineering\",\"volume\":\"15 1\",\"pages\":\"275-284\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Serbian Journal of Electrical Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2298/SJEE1803275R\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Serbian Journal of Electrical Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2298/SJEE1803275R","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}

引用次数: 2

摘要

采用丝网印刷技术在氧化铝基体上制备了镍钴锌铁氧体无熔结厚膜。采用x射线衍射和扫描电镜技术进行结构分析。提出了一种利用微波性质摄动测定复合介电常数(和)的新方法。采用有和无厚膜衬底的银厚膜微带环形谐振器(MSRR)进行了8 ~ 12 GHz频段的微波传输研究。厚膜的微波导电性在1.779 ~ 2.296 S/cm之间。在微波频率的x波段内也报道了穿透深度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Resonance shifting by ferrite thick film superstrate

Fritless thick films of Ni-Co-Zn ferrites were fabricated by screen printing technique on alumina substrates. Structural analysis was undertaken using X-ray diffraction and Scanning electron microscopy techniques. A new approach for the determination of complex permittivity (   and   ) using microwave property perturbation is unveiled. Ag thick film microstrip ring resonator (MSRR) with and without the thick film substrate was used for the microwave transmission studies in the frequency region of 812 GHz. The microwave conductivity of the thick films lies in the range of 1.779 S/cm to 2.296 S/cm. The penetration depth is also reported within the X-band of microwave frequencies.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Serbian Journal of Electrical Engineering Energy-Energy Engineering and Power Technology

CiteScore

1.30

自引率

0.00%

发文量

审稿时长

25 weeks

期刊介绍： The main aims of the Journal are to publish peer review papers giving results of the fundamental and applied research in the field of electrical engineering. The Journal covers a wide scope of problems in the following scientific fields: Applied and Theoretical Electromagnetics, Instrumentation and Measurement, Power Engineering, Power Systems, Electrical Machines, Electrical Drives, Electronics, Telecommunications, Computer Engineering, Automatic Control and Systems, Mechatronics, Electrical Materials, Information Technologies, Engineering Mathematics, etc.