{"title":"PREST:一个可测试性的逻辑划分和再合成系统","authors":"K. De;P. Banerjee","doi":"10.1109/92.250199","DOIUrl":null,"url":null,"abstract":"The authors propose a heuristic procedure for partitioning a circuit into several blocks so that after the resynthesis of each block and subsequent reconnection there is a near-minimal number of redundant faults in the circuit. A probabilistic technique is used to estimate the size of a don't care set, and the partitioning approach tries to reduce the don't care size across the partitions. The approach, called PREST (for Partitioning and RESynthesis for Testability), has been applied on various MCNC and ISCAS benchmark circuits, and excellent results in terms of the size and testability of the synthesized circuit have been obtained.<\n<ETX>></ETX>","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"1 4","pages":"514-525"},"PeriodicalIF":2.8000,"publicationDate":"1993-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/92.250199","citationCount":"8","resultStr":"{\"title\":\"PREST: a system for logic partitioning and resynthesis for testability\",\"authors\":\"K. De;P. Banerjee\",\"doi\":\"10.1109/92.250199\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors propose a heuristic procedure for partitioning a circuit into several blocks so that after the resynthesis of each block and subsequent reconnection there is a near-minimal number of redundant faults in the circuit. A probabilistic technique is used to estimate the size of a don't care set, and the partitioning approach tries to reduce the don't care size across the partitions. The approach, called PREST (for Partitioning and RESynthesis for Testability), has been applied on various MCNC and ISCAS benchmark circuits, and excellent results in terms of the size and testability of the synthesized circuit have been obtained.<\\n<ETX>></ETX>\",\"PeriodicalId\":13425,\"journal\":{\"name\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"volume\":\"1 4\",\"pages\":\"514-525\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"1993-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1109/92.250199\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/250199/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/250199/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
PREST: a system for logic partitioning and resynthesis for testability
The authors propose a heuristic procedure for partitioning a circuit into several blocks so that after the resynthesis of each block and subsequent reconnection there is a near-minimal number of redundant faults in the circuit. A probabilistic technique is used to estimate the size of a don't care set, and the partitioning approach tries to reduce the don't care size across the partitions. The approach, called PREST (for Partitioning and RESynthesis for Testability), has been applied on various MCNC and ISCAS benchmark circuits, and excellent results in terms of the size and testability of the synthesized circuit have been obtained.<
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期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.