{"title":"小数据处理中异常值的检测","authors":"В. С. Попукайло, V. Popukaylo","doi":"10.15222/TKEA2016.4-5.42","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":30281,"journal":{"name":"Tekhnologiya i Konstruirovanie v Elektronnoi Apparature","volume":"1 1","pages":"42-46"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Detection of outliers in processing of small size data\",\"authors\":\"В. С. Попукайло, V. Popukaylo\",\"doi\":\"10.15222/TKEA2016.4-5.42\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":30281,\"journal\":{\"name\":\"Tekhnologiya i Konstruirovanie v Elektronnoi Apparature\",\"volume\":\"1 1\",\"pages\":\"42-46\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Tekhnologiya i Konstruirovanie v Elektronnoi Apparature\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.15222/TKEA2016.4-5.42\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Tekhnologiya i Konstruirovanie v Elektronnoi Apparature","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15222/TKEA2016.4-5.42","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}