纳米材料的表征:核壳纳米粒子的XPS分析

W. Werner, Martin Hronek, M. Pollach, Henryk Kalbe
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引用次数: 0

摘要

提出并比较了量化壳体厚度的不同方法。这些包括:(1)无穷小柱模型(IC), (2) Shard的经验公式(tnp模型)和(3)SESSA(表面分析的电子能谱模拟)模拟有和(4)没有弹性散射。用上述方法对PMMA@PTFE csnp的轮循实验数据进行了分析,结果显示出良好的相互一致性,与标称壳厚一致。然而,使用F1s信号会导致显著的偏差。透射电镜测量表明,核壳结构是非理想的,即粒子是非球形的,粒子内的核是偏心的。采用SESSA模拟来估计理想NPs的各种偏差对壳厚测定结果的影响。讨论了各种电子束技术对CSNP分析,特别是壳层厚度测定的有用性和重要性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Characterisation of nanomaterials: XPS analysis of Core-Shell Nanoparticles
Different approaches to quantify shell thicknesses are presented and compared. These comprise: (1) The infinitesimal columns model (IC), (2) Shard’s empirical formula (TNP-model) and (3) SESSA (Simulation of Electron Spectra for Surface Analysis) simulations with and (4) without elastic scattering. Experimental data on of a round robin experiment of PMMA@PTFE CSNPs were analysed with the aforementioned approaches and show a good mutual consistency and agree with the nominal shell thickness. However, use of the F1s signal leads to significant deviations. Transmission Electron Microscopy measurements revealed that the core-shell structure is non-ideal, i.e. the particles are aspherical and the cores are acentric within the particles. SESSA simulations were employed to estimate the effect of various types of deviations of ideal NPs on the outcome of shell thickness determination. The usefulness and importance of different kind of electron beam techniques for CSNP analysis and in particular shell thickness determination is discussed.
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