单模态保留结构失效前后信号完整性分析

Y. Zhechev, A. Medvedev, T. Gazizov
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引用次数: 0

摘要

为了提高无线电电子设备的可靠性,工程师们使用了最相关电路的冗余。最简单和最常见的解决方案是经典的冷冗余,其中主电路和冗余电路彼此相距很远。同时,将主电路和冗余电路靠近在一起,可以使用模态失真来保护两个电路免受不必要的超宽带干扰。这种方法被称为模态冗余或模态保留(MR)。本文给出了单磁流变结构失效前后的信号完整性分析结果。结果表明,故障后的带宽发生了变化。这影响了可以被激发到设备输入的数据的速率,而不会对有用信号造成明显的失真。作者使用了数据速率为50和200 Mbps的伪随机二进制序列。实验结果表明,冗余电路的故障不会显著降低带宽下的信号完整性质量。因此,与数据相关的抖动从12(故障前)变为19 ps(最严重故障后)。在所有被调查的变异中,眼睛一直睁着;因此,误码率将会很低。冗余电路的失配对噪声幅值的影响最大。结果,信噪比从57(故障前)下降到28(最严重故障后)。为了证实测量结果,我们进行了电动力学模拟。结果与实验数据吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Signal Integrity Analysis of the Structure with Single Modal Reservation Before and After Failures
To improve the reliability of radio electronic devices, engineers use redundancy of the most relevant circuits. The simplest and most common solution is classical cold redundancy in which the primary and redundant circuits are located far from each other. Meanwhile, locating the primary and redundant circuits close together makes it possible to use modal distortions to protect both circuits from unwanted ultra-wideband interference. This approach is known as modal redundancy or modal reservation (MR). This paper presents the results of signal integrity analysis for a structure with single MR before and after failures. It is shown that the bandwidth after failures changes. This affects the rate of data that can be excited to the input of the device without significant distortion of the useful signal. The authors used pseudorandom binary sequences with a data rate of 50 and 200 Mbps. It is experimentally shown that failures in the redundant circuit do not significantly degrade the quality of signal integrity in the bandwidth. Thus, the data-dependent jitter changes from 12 (before failures) to 19 ps (after the worst failure). In all investigated variants, the eye stays open; as a result, the bit error rate will be low. The mismatch of the redundant circuit has the largest effect on the noise amplitude. As a result, the signal-to-noise ratio decreases from 57 (before failures) to 28 (after the worst failure). To confirm the measurements, we performed electrodynamic simulations. Their results are in good agreement with the experimental data.
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