{"title":"高速数字工程师的s参数:初学者指南","authors":"E. Bogatin","doi":"10.1109/MEMC.2023.10134760","DOIUrl":null,"url":null,"abstract":"Scattering or S-parameters, have been used in RF applications for more than 70 years [1]. However, it has only been in the last 30 years they have been used extensively in high-speed digital applications, such as signal integrity, power integrity and EMC, and then only slowly accepted by the general community.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"12 1","pages":"34-41"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"S-Parameters for High Speed Digital Engineers: A Beginner's Guide\",\"authors\":\"E. Bogatin\",\"doi\":\"10.1109/MEMC.2023.10134760\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Scattering or S-parameters, have been used in RF applications for more than 70 years [1]. However, it has only been in the last 30 years they have been used extensively in high-speed digital applications, such as signal integrity, power integrity and EMC, and then only slowly accepted by the general community.\",\"PeriodicalId\":73281,\"journal\":{\"name\":\"IEEE electromagnetic compatibility magazine\",\"volume\":\"12 1\",\"pages\":\"34-41\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE electromagnetic compatibility magazine\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEMC.2023.10134760\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE electromagnetic compatibility magazine","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMC.2023.10134760","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
S-Parameters for High Speed Digital Engineers: A Beginner's Guide
Scattering or S-parameters, have been used in RF applications for more than 70 years [1]. However, it has only been in the last 30 years they have been used extensively in high-speed digital applications, such as signal integrity, power integrity and EMC, and then only slowly accepted by the general community.
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