技术主题

F. Grassi
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引用次数: 0

摘要

电磁近场扫描已经受到了EMC工程师的极大关注,因为它使人们能够理解电子元件和子系统的电磁行为。该技术允许在产品的早期设计阶段对系统内部和系统间的EMC特性进行评估,而不需要昂贵的测试设施,如半消声室。此外,获取的近场数据可以进行后处理,以获得等效辐射源分布,用于预测远场辐射。数据采集和后处理通常利用先进的机器学习算法,利用这些算法可以在时间、计算负担和预测精度方面优化过程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Technical Theme Topics
Protecting critical infrastructures, such as utilities (e.g. power utilities) and services (e.g. data and communication), against electromagnetic pulses (EMP) is a critical challenge for EMC engineers. Large-scale threats are associated with nuclear detonations, known as high-altitude EMP (HEMP). On a smaller scale, high-power microwave (HPM) weapons have smaller range and power but higher frequency content. Key aspects for electronics protection include the prediction of the disturbance reaching the susceptible device on the one hand, and the assessment of device vulnerability to such disturbance on the other.
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CiteScore
0.80
自引率
0.00%
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0
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