{"title":"用计算机索引叠加选择区衍射(SAD)图案","authors":"R.A. Ploc","doi":"10.1016/0047-7206(83)90032-8","DOIUrl":null,"url":null,"abstract":"<div><p>A computer program written to separate and identify superimposed Selected Area Electron <em>D</em>iffaction (SAD) patterns is reported. Prior knowledge of reflection types and their spatial positions within a Wulff net is required.</p></div>","PeriodicalId":100924,"journal":{"name":"Micron (1969)","volume":"14 1","pages":"Pages 57-61"},"PeriodicalIF":0.0000,"publicationDate":"1983-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0047-7206(83)90032-8","citationCount":"0","resultStr":"{\"title\":\"Indexing superimposed selected area diffraction (SAD) patterns by computer\",\"authors\":\"R.A. Ploc\",\"doi\":\"10.1016/0047-7206(83)90032-8\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A computer program written to separate and identify superimposed Selected Area Electron <em>D</em>iffaction (SAD) patterns is reported. Prior knowledge of reflection types and their spatial positions within a Wulff net is required.</p></div>\",\"PeriodicalId\":100924,\"journal\":{\"name\":\"Micron (1969)\",\"volume\":\"14 1\",\"pages\":\"Pages 57-61\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1983-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0047-7206(83)90032-8\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Micron (1969)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0047720683900328\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron (1969)","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0047720683900328","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Indexing superimposed selected area diffraction (SAD) patterns by computer
A computer program written to separate and identify superimposed Selected Area Electron Diffaction (SAD) patterns is reported. Prior knowledge of reflection types and their spatial positions within a Wulff net is required.
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