薄蒸发铜膜与氧化铜的取向关系

Micron (1969) Pub Date : 1983-01-01 DOI:10.1016/0047-7206(83)90031-6

Lukas Beck, John R. Günter

{"title":"薄蒸发铜膜与氧化铜的取向关系","authors":"Lukas Beck, John R. Günter","doi":"10.1016/0047-7206(83)90031-6","DOIUrl":null,"url":null,"abstract":"<div><p>The oxidation of thin evaporated copper films on alkali halide substrates yields highly oriented copper(I) oxide. Selected area electron diffraction shows the existence of four different sets of orientation relations between copper and its oxide, partly unobserved in previous studies. This illustrates the danger of transferring data obtained from other material to thin films prepared in a specific way without taking into account the morphology of the latter.</p></div>","PeriodicalId":100924,"journal":{"name":"Micron (1969)","volume":"14 1","pages":"Pages 53-56"},"PeriodicalIF":0.0000,"publicationDate":"1983-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0047-7206(83)90031-6","citationCount":"2","resultStr":"{\"title\":\"Orientation relations between thin evaporated copper films and copper(I) oxide\",\"authors\":\"Lukas Beck, John R. Günter\",\"doi\":\"10.1016/0047-7206(83)90031-6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The oxidation of thin evaporated copper films on alkali halide substrates yields highly oriented copper(I) oxide. Selected area electron diffraction shows the existence of four different sets of orientation relations between copper and its oxide, partly unobserved in previous studies. This illustrates the danger of transferring data obtained from other material to thin films prepared in a specific way without taking into account the morphology of the latter.</p></div>\",\"PeriodicalId\":100924,\"journal\":{\"name\":\"Micron (1969)\",\"volume\":\"14 1\",\"pages\":\"Pages 53-56\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1983-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0047-7206(83)90031-6\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Micron (1969)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0047720683900316\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron (1969)","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0047720683900316","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

在碱卤化物衬底上氧化薄蒸发铜膜，得到高取向的氧化铜。选择区电子衍射显示了铜及其氧化物之间存在四组不同的取向关系，这在以前的研究中部分未被观察到。这说明了将从其他材料获得的数据转移到以特定方式制备的薄膜上而不考虑后者的形态的危险。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Orientation relations between thin evaporated copper films and copper(I) oxide

The oxidation of thin evaporated copper films on alkali halide substrates yields highly oriented copper(I) oxide. Selected area electron diffraction shows the existence of four different sets of orientation relations between copper and its oxide, partly unobserved in previous studies. This illustrates the danger of transferring data obtained from other material to thin films prepared in a specific way without taking into account the morphology of the latter.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Micron (1969)

自引率

0.00%

发文量