{"title":"用于跟踪静止故障孤单现象","authors":"H. Bandemer, Le Anh Son","doi":"10.1002/BIMJ.19730150108","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":78882,"journal":{"name":"Biometrische Zeitschrift","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1973-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1002/BIMJ.19730150108","citationCount":"0","resultStr":"{\"title\":\"Zur Beobachtung stochastischer Einschwingprozesse mit stationärem Fehleranteil\",\"authors\":\"H. Bandemer, Le Anh Son\",\"doi\":\"10.1002/BIMJ.19730150108\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":78882,\"journal\":{\"name\":\"Biometrische Zeitschrift\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1973-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1002/BIMJ.19730150108\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Biometrische Zeitschrift\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/BIMJ.19730150108\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Biometrische Zeitschrift","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/BIMJ.19730150108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}