物联网隐私保护的最新趋势、挑战和未来方向

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Mahdi Safaei Yaraziz, Ahmad Jalili, Mehdi Gheisari, Yang Liu
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引用次数: 2

摘要

物联网(IoT)是一个自配置的智能系统,在这个系统中,自主事物连接到互联网并相互通信。由于“事物”是自主的,这可能会引发隐私问题。在这项研究中,作者描述了物联网系统的背景以及隐私和安全措施,包括(a)在基于物联网的系统中保护隐私的方法,(b)现有的隐私解决方案,以及(c)为物联网应用的不同层推荐隐私模型。根据我们的研究结果,很明显,区块链、机器学习、数据最小化和数据加密等新方法可以极大地影响隐私问题,以确保安全和隐私。此外,如果智能设备可以收集、存储和共享的数据更少,用户可以更容易地保护自己的个人信息,这是有道理的。因此,本研究提出了一种基于机器学习的数据最小化方法,在这些网络中,该方法对保护隐私非常有益。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Recent trends towards privacy-preservation in Internet of Things, its challenges and future directions

Recent trends towards privacy-preservation in Internet of Things, its challenges and future directions

The Internet of Things (IoT) is a self-configuring, intelligent system in which autonomous things connect to the Internet and communicate with each other. As ‘things’ are autonomous, it may raise privacy concerns. In this study, the authors describe the background of IoT systems and privacy and security measures, including (a) approaches to preserving privacy in IoT-based systems, (b) existing privacy solutions, and (c) recommending privacy models for different layers of IoT applications. Based on the results of our study, it is clear that new methods such as Blockchain, Machine Learning, Data Minimisation, and Data Encryption can greatly impact privacy issues to ensure security and privacy. Moreover, it makes sense that users can protect their personal information easier if there is fewer data to collect, store, and share by smart devices. Thus, this study proposes a machine learning-based data minimisation method that, in these networks, can be very beneficial for privacy-preserving.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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