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引用次数: 1
摘要
收回:【袁佳正,王庄,程旭,李洪天,戴松音,刘洪哲,基于差分隐私的自主传感器网络多车群感知数据保护模型,IET电路、设备与系统2022(https://doi.org/10.1049/cds2.12140)]。来自IET Circuits,Devices&;《系统》于2022年12月29日在威利在线图书馆(wileyonlinelibrary.com)在线出版,经主编Harry E.Ruda、工程与技术学会(IET)和John Wiley and Sons有限公司同意撤回。本文作为客座编辑特刊的一部分出版。经过调查,IET和该杂志确定,这篇文章没有按照该杂志的同行评审标准进行评审,有证据表明,该特刊的同行评审过程受到了系统的操纵。因此,我们不能保证内容的完整性或可靠性。因此,我们决定收回这篇文章。提交人已被告知撤回的决定。
Retracted: Multi-vehicle group-aware data protection model based on differential privacy for autonomous sensor networks
Retraction: [Jiazheng Yuan, Zhuang Wang, Cheng Xu, Hongtian Li, Songyin Dai, Hongzhe Liu, Multi-vehicle group-aware data protection model based on differential privacy for autonomous sensor networks, IET Circuits, Devices & Systems 2022 (https://doi.org/10.1049/cds2.12140)].
The above article from IET Circuits, Devices & Systems, published online on 29 December 2022 in Wiley Online Library (wileyonlinelibrary.com), has been retracted by agreement between the Editor-in-Chief, Harry E. Ruda, the Institution of Engineering and Technology (the IET) and John Wiley and Sons Ltd. This article was published as part of a Guest Edited special issue. Following an investigation, the IET and the journal have determined that the article was not reviewed in line with the journal's peer review standards and there is evidence that the peer revie process of the special issue underwent systematic manipulation. Accordingly, we cannot vouch for the integrity or reliability of the content. As such we have taken the decision to retract the article. The authors have been informed of the decision to retract.
期刊介绍:
IET Circuits, Devices & Systems covers the following topics:
Circuit theory and design, circuit analysis and simulation, computer aided design
Filters (analogue and switched capacitor)
Circuit implementations, cells and architectures for integration including VLSI
Testability, fault tolerant design, minimisation of circuits and CAD for VLSI
Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs
Device and process characterisation, device parameter extraction schemes
Mathematics of circuits and systems theory
Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers