A. Deshpande, Aniket Bharamgonda, Q. Jiang, Abhijit Dasgupta
{"title":"SAC305低晶焊点的晶粒尺度研究:单晶各向异性弹塑性本构性能","authors":"A. Deshpande, Aniket Bharamgonda, Q. Jiang, Abhijit Dasgupta","doi":"10.1115/1.4063325","DOIUrl":null,"url":null,"abstract":"\n This paper focuses on anisotropic elastic-plastic constitutive modeling of SAC (SnAgCu) solder grains because of their importance in modeling the behavior of oligocrystalline (few-grained) micron-scale solder joints that are increasingly common in heterogeneous integration. Such grain-scale anisotropic modeling approach provides more accurate assessment of the mechanical response of solder interconnects in terms of predicting different failure modes, failure sites and variability in time-to-failure. Anisotropic plasticity is represented using Hill-Ramberg Osgood continuum plasticity model, which utilizes Hill's anisotropic plastic potential, along with a Ramberb-Osgood (RO) power-law plastic hardening flow rule. Mechanistically motivated empirical scaling factors are proposed to extrapolate the stress-strain response for different grain sizes/shapes and for different coarseness of microstructures within each grain (generated with different cooling rates). This scaling factor can therefore also capture the effects of microstructural coarsening due to isothermal aging. This goal is achieved by first conducting monotonic tensile and shear tests on monocrystalline and oligocrystalline SAC305 solder joints containing grains of various geometries and also intragranular microscale (dendritic and eutectic) structures of various coarseness. The grain structures are characterized for each tested specimen using electron backscattered diffraction (EBSD). The Hill-RO model constants and the empirical scaling factors are then estimated by matching grain-scale anisotropic elastic-plastic finite element models of each tested specimen to the measured stress-strain behavior, using an inverse-iteration process. Grain shape is seen to influence the sensitivity of the effective stress-strain curves to the applied stress state (i.e. to the orientation of the principal stress directions), relative to (i) the material principal directions and (ii) the geometric principal directions of grains with high aspect ratio. Limitations of the current results and opportunities for future improvements are discussed.","PeriodicalId":15663,"journal":{"name":"Journal of Electronic Packaging","volume":" ","pages":""},"PeriodicalIF":2.2000,"publicationDate":"2023-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Grain-Scale Study of SAC305 Oligocrystalline Solder Joints: Anisotropic Elasto-Plastic Constitutive Properties of Single-Crystals\",\"authors\":\"A. Deshpande, Aniket Bharamgonda, Q. Jiang, Abhijit Dasgupta\",\"doi\":\"10.1115/1.4063325\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n This paper focuses on anisotropic elastic-plastic constitutive modeling of SAC (SnAgCu) solder grains because of their importance in modeling the behavior of oligocrystalline (few-grained) micron-scale solder joints that are increasingly common in heterogeneous integration. Such grain-scale anisotropic modeling approach provides more accurate assessment of the mechanical response of solder interconnects in terms of predicting different failure modes, failure sites and variability in time-to-failure. Anisotropic plasticity is represented using Hill-Ramberg Osgood continuum plasticity model, which utilizes Hill's anisotropic plastic potential, along with a Ramberb-Osgood (RO) power-law plastic hardening flow rule. Mechanistically motivated empirical scaling factors are proposed to extrapolate the stress-strain response for different grain sizes/shapes and for different coarseness of microstructures within each grain (generated with different cooling rates). This scaling factor can therefore also capture the effects of microstructural coarsening due to isothermal aging. This goal is achieved by first conducting monotonic tensile and shear tests on monocrystalline and oligocrystalline SAC305 solder joints containing grains of various geometries and also intragranular microscale (dendritic and eutectic) structures of various coarseness. The grain structures are characterized for each tested specimen using electron backscattered diffraction (EBSD). The Hill-RO model constants and the empirical scaling factors are then estimated by matching grain-scale anisotropic elastic-plastic finite element models of each tested specimen to the measured stress-strain behavior, using an inverse-iteration process. Grain shape is seen to influence the sensitivity of the effective stress-strain curves to the applied stress state (i.e. to the orientation of the principal stress directions), relative to (i) the material principal directions and (ii) the geometric principal directions of grains with high aspect ratio. Limitations of the current results and opportunities for future improvements are discussed.\",\"PeriodicalId\":15663,\"journal\":{\"name\":\"Journal of Electronic Packaging\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2023-09-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Packaging\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1115/1.4063325\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Packaging","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1115/1.4063325","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Grain-Scale Study of SAC305 Oligocrystalline Solder Joints: Anisotropic Elasto-Plastic Constitutive Properties of Single-Crystals
This paper focuses on anisotropic elastic-plastic constitutive modeling of SAC (SnAgCu) solder grains because of their importance in modeling the behavior of oligocrystalline (few-grained) micron-scale solder joints that are increasingly common in heterogeneous integration. Such grain-scale anisotropic modeling approach provides more accurate assessment of the mechanical response of solder interconnects in terms of predicting different failure modes, failure sites and variability in time-to-failure. Anisotropic plasticity is represented using Hill-Ramberg Osgood continuum plasticity model, which utilizes Hill's anisotropic plastic potential, along with a Ramberb-Osgood (RO) power-law plastic hardening flow rule. Mechanistically motivated empirical scaling factors are proposed to extrapolate the stress-strain response for different grain sizes/shapes and for different coarseness of microstructures within each grain (generated with different cooling rates). This scaling factor can therefore also capture the effects of microstructural coarsening due to isothermal aging. This goal is achieved by first conducting monotonic tensile and shear tests on monocrystalline and oligocrystalline SAC305 solder joints containing grains of various geometries and also intragranular microscale (dendritic and eutectic) structures of various coarseness. The grain structures are characterized for each tested specimen using electron backscattered diffraction (EBSD). The Hill-RO model constants and the empirical scaling factors are then estimated by matching grain-scale anisotropic elastic-plastic finite element models of each tested specimen to the measured stress-strain behavior, using an inverse-iteration process. Grain shape is seen to influence the sensitivity of the effective stress-strain curves to the applied stress state (i.e. to the orientation of the principal stress directions), relative to (i) the material principal directions and (ii) the geometric principal directions of grains with high aspect ratio. Limitations of the current results and opportunities for future improvements are discussed.
期刊介绍:
The Journal of Electronic Packaging publishes papers that use experimental and theoretical (analytical and computer-aided) methods, approaches, and techniques to address and solve various mechanical, materials, and reliability problems encountered in the analysis, design, manufacturing, testing, and operation of electronic and photonics components, devices, and systems.
Scope: Microsystems packaging; Systems integration; Flexible electronics; Materials with nano structures and in general small scale systems.