Cr Kα激发Si3N4薄膜的高能光电子能谱

IF 1.6 Q3 PHYSICS, CONDENSED MATTER
P. Deleuze, K. Artyushkova, E. Martinez, O. Renault
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引用次数: 0

摘要

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High-energy photoelectron spectroscopy of Si3N4 thin film on Si with Cr Kα excitation
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来源期刊
Surface Science Spectra
Surface Science Spectra PHYSICS, CONDENSED MATTER-
CiteScore
1.90
自引率
7.70%
发文量
36
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