TAJ评审员名单_2018

IF 4.3 3区材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

ACS Applied Electronic Materials Pub Date : 2019-01-01 DOI:10.1177/2040622319829270

Tounsia, Alavi, Afraneh, Anitua, Ansari, Antoniu, Ayhan, Aucella, David, Beales, Ian, Bielefeld, William, Carrascosa, Cynthia, Danby, Mervyn, Espósito, Esteban, Greenwood, G. Darren, Grieshaber, Matthias, Harvey, John, Huang, Florenzo, Jing, Se-Won, Kao, Jia-Horng, Kataoka, Yoko, Krivoy, Linnebank, Michael, Llamas Velasco, Mar, Loughrey, G. David, Luchesi, Kf, Macaluso, Toshimi, Michopoulos, Eydie, Mossello, Joachim, Musiałek, Piotr, Nakhostin Ansari, Ole, Nowakowski, Sarah, Pilz, Danielle, Puig, Sm, Schofield, Rc, Shrivastava, Vimal, Stenager

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引用次数: 0

摘要

知识共享非商业CC BY-NC：本文根据知识共享归因非商业4.0许可条款分发(http://www.creativecommons.org/licenses/by-nc/4.0/)允许对作品进行非商业性使用、复制和分发，而无需进一步许可，前提是原始作品的归属符合SAGE和开放获取页面的规定(https://us.sagepub.com/en-us/nam/open-access-at-sage)。Abdul Ghani、Muhammad Abdulla、Aza Aiet Slimane、Tounsia Alavi、Afraneh Anitua、E Ansari、E Antoniu、SA Aşkın、Ayhan Aucella、F Barr、David Beales、Ian Bielefeld、P Bölük、C Bonomini、M Brunner、Patrick Cahoon、William Carrascosa、JM Carrette、Sofie Chang、TP Chiricozzi、Andrea Cohen、D Corbatón Anchuelo、Arturo Crowson、Cynthia Danby、Simon Daugherty、AM Dieter、Brad Dodiuk Gad、RP Eadie，Mervyn Esposito、P Ferreira Cardoso、Mariana Fisher、Robert Fu、Ping Galimova、Elvira Galluzzo、M Gambazza、S George、Yasmin Gibson、David J Glantz、Stanton A González、Esteban Greenwood、SA Gregory、Darren G Grieshaber、Matthias Harvey、John Huang、L Iannone、Florenzo Jing、ZC Kang、Se Won Kao、Jia Horng Kataoka、Yoko Krivoy、A Linnebank、Michael Llamas Velasco、Mar Loughrey、David G Luchesi，KF Macaluso、Fabio Malčić、i Michigami、Toshimi Michopoulos、Spyridon Miller Ellis、Eudie Mossello、Enrico Müller Quernheim、Joachim Musiałek、Piotr Nakhostin Ansari、N Nashef、Lina Navas Acien、Ana Nielsen、Ole Nowakowski、Alexandra Osborn、Katie Panza、Francesco Perry、Sarah Pilz、W Powell、Danielle Puig、Lluís Raina、A Razzaque、Mohammed Ring、Hans Ruan、Qingwei Rudaz、s Ruperto、M Rusu，E Saldaña、SN Sangwan、Virender S Savvas、SM Schofield、P Schröder、N Shah、RC Shrivastava、Vimal Stenager、E TAJ评审员名单_2018

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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TAJ-Reviewer list_2018

Creative Commons Non Commercial CC BY-NC: This article is distributed under the terms of the Creative Commons Attribution-NonCommercial 4.0 License (http://www.creativecommons.org/licenses/by-nc/4.0/) which permits non-commercial use, reproduction and distribution of the work without further permission provided the original work is attributed as specified on the SAGE and Open Access pages (https://us.sagepub.com/en-us/nam/open-access-at-sage). Abdul-Ghani, Muhammad Abdulla, Aza Aiet-Slimane, Tounsia Alavi, Afraneh Anitua, E Ansari, E Antoniu, SA Aşkın, Ayhan Aucella, F Barr, David Beales, Ian Bielefeld, P Bölük, C Bonomini, M Brunner, Patrick Cahoon, William Carrascosa, JM Carrette, Sofie Chang, TP Chiricozzi, Andrea Cohen, D Corbatón Anchuelo, Arturo Crowson, Cynthia Danby, Simon Daugherty, AM Dieter, Brad Dodiuk-Gad, RP Eadie, Mervyn Esposito, P Ferreira Cardoso, Mariana Fisher, Robert Fu, Ping Galimova, Elvira Galluzzo, M Gambazza, S George, Yasmin Gibson, David J Glantz, Stanton A González, Esteban Greenwood, SA Gregory, Darren G Grieshaber, Matthias Harvey, John Huang, L Iannone, Florenzo Jing, ZC Kang, Se-Won Kao, Jia-Horng Kataoka, Yoko Krivoy, A Linnebank, Michael Llamas Velasco, Mar Loughrey, David G Luchesi, KF Macaluso, Fabio Malčić, I Michigami, Toshimi Michopoulos, Spyridon Miller-Ellis, Eydie Mossello, Enrico Müller-Quernheim, Joachim Musiałek, Piotr Nakhostin Ansari, N Nashef, Lina Navas-Acien, Ana Nielsen, Ole Nowakowski, Alexandra Osborn, Katie Panza, Francesco Perry, Sarah Pilz, W Powell, Danielle Puig, Lluís Raina, A Razzaque, Mohammed Ring, Hans Ruan, Qingwei Rudaz, S Ruperto, M Rusu, E Saldaña, SN Sangwan, Virender S Savvas, SM Schofield, P Schröder, N Shah, RC Shrivastava, Vimal Stenager, E TAJ-Reviewer list_2018

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来源期刊

ACS Applied Electronic Materials Multiple-

CiteScore

7.20

自引率

4.30%

发文量

567