A. Aqili, T. Abu-Omar, A. Al-Reyahi, A. Shaheen, S. Al-Omari, I. Alhagish
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Effect of phosphoric acid treatment on the physical properties of zinc telluride thin films
Zinc Telluride (ZnTe) films were prepared by the closed space sublimation (CSS) method. The effect of chemical treatments with concentrated phosphoric acid, on the optical, electric and structural properties of the films was studied. Zinc-blend structure of the polycrystalline nature of the films was confirmed by x-ray diffraction (XRD) spectra. The energy dispersive x-ray (EDX) shows an increase in Te ratio on the surface of the film as exposed to phosphoric acid. In addition, the dc electrical resistivity of the films was dropped considerably. The refractive index, thickness, and thickness irregularity of the films were determined by fitting of the optical transmittance spectra in the wavelength range 400 to 2500 nm. The effect, of treatment, on the optical parameters is also reported.
期刊介绍:
Chalcogenide Letters (CHL) has the aim to publish rapidly papers in chalcogenide field of research and
appears with twelve issues per year. The journal is open to letters, short communications and breakings news
inserted as Short Notes, in the field of chalcogenide materials either amorphous or crystalline. Short papers in
structure, properties and applications, as well as those covering special properties in nano-structured
chalcogenides are admitted.