用Cr Kα测量Si3N4的高能x射线光电子能谱

IF 1.6 Q3 PHYSICS, CONDENSED MATTER
I. Hoflijk, A. Vanleenhove, I. Vaesen, C. Zborowski, K. Artyushkova, T. Conard
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High energy x-ray photoelectron spectroscopy spectra of Si3N4 measured by Cr Kα
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来源期刊
Surface Science Spectra
Surface Science Spectra PHYSICS, CONDENSED MATTER-
CiteScore
1.90
自引率
7.70%
发文量
36
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