比特翻转对明文和密文深度神经网络精度影响的探讨

IF 2.8 3区 计算机科学 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Micro Pub Date : 2023-09-01 DOI:10.1109/MM.2023.3273115
Kyle Thomas, Muhammad Santriaji, David A. Mohaisen, Yan Solihin
{"title":"比特翻转对明文和密文深度神经网络精度影响的探讨","authors":"Kyle Thomas, Muhammad Santriaji, David A. Mohaisen, Yan Solihin","doi":"10.1109/MM.2023.3273115","DOIUrl":null,"url":null,"abstract":"Neural networks (NNs) are increasingly deployed to solve complex classification problems and produce accurate results on reliable systems. However, their accuracy quickly degrades in the presence of bit flips from memory errors or targeted attacks on dynamic random-access main memory. Prior work has shown that a few bit errors significantly reduce NN accuracies, but it is unclear which bits have an outsized impact on network accuracy and why. This article first investigates the relationship of the number representation for NN parameters with the impacts of bit flips on NN accuracy. We then explore the bit flip detection framework— four software-based error detectors that detect bit flips independent of NN topology. We discuss exciting findings and evaluate the various detectors’ efficacy, characteristics, and tradeoffs.","PeriodicalId":13100,"journal":{"name":"IEEE Micro","volume":"43 1","pages":"24-34"},"PeriodicalIF":2.8000,"publicationDate":"2023-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Exploration of Bitflip’s Effect on Deep Neural Network Accuracy in Plaintext and Ciphertext\",\"authors\":\"Kyle Thomas, Muhammad Santriaji, David A. Mohaisen, Yan Solihin\",\"doi\":\"10.1109/MM.2023.3273115\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Neural networks (NNs) are increasingly deployed to solve complex classification problems and produce accurate results on reliable systems. However, their accuracy quickly degrades in the presence of bit flips from memory errors or targeted attacks on dynamic random-access main memory. Prior work has shown that a few bit errors significantly reduce NN accuracies, but it is unclear which bits have an outsized impact on network accuracy and why. This article first investigates the relationship of the number representation for NN parameters with the impacts of bit flips on NN accuracy. We then explore the bit flip detection framework— four software-based error detectors that detect bit flips independent of NN topology. We discuss exciting findings and evaluate the various detectors’ efficacy, characteristics, and tradeoffs.\",\"PeriodicalId\":13100,\"journal\":{\"name\":\"IEEE Micro\",\"volume\":\"43 1\",\"pages\":\"24-34\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2023-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Micro\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1109/MM.2023.3273115\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Micro","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/MM.2023.3273115","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

摘要

神经网络被越来越多地用于解决复杂的分类问题,并在可靠的系统上产生准确的结果。然而,在内存错误或对动态随机存取主内存的有针对性攻击导致比特翻转的情况下,它们的准确性会迅速下降。先前的工作表明,一些比特错误会显著降低神经网络的精度,但尚不清楚哪些比特对网络精度有过大的影响以及原因。本文首先研究了神经网络参数的数字表示与比特翻转对神经网络精度的影响之间的关系。然后,我们探索了位翻转检测框架——四个基于软件的错误检测器,它们检测独立于NN拓扑的位翻转。我们讨论了令人兴奋的发现,并评估了各种探测器的功效、特性和权衡。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Exploration of Bitflip’s Effect on Deep Neural Network Accuracy in Plaintext and Ciphertext
Neural networks (NNs) are increasingly deployed to solve complex classification problems and produce accurate results on reliable systems. However, their accuracy quickly degrades in the presence of bit flips from memory errors or targeted attacks on dynamic random-access main memory. Prior work has shown that a few bit errors significantly reduce NN accuracies, but it is unclear which bits have an outsized impact on network accuracy and why. This article first investigates the relationship of the number representation for NN parameters with the impacts of bit flips on NN accuracy. We then explore the bit flip detection framework— four software-based error detectors that detect bit flips independent of NN topology. We discuss exciting findings and evaluate the various detectors’ efficacy, characteristics, and tradeoffs.
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来源期刊
IEEE Micro
IEEE Micro 工程技术-计算机:软件工程
CiteScore
7.50
自引率
0.00%
发文量
164
审稿时长
>12 weeks
期刊介绍: IEEE Micro addresses users and designers of microprocessors and microprocessor systems, including managers, engineers, consultants, educators, and students involved with computers and peripherals, components and subassemblies, communications, instrumentation and control equipment, and guidance systems. Contributions should relate to the design, performance, or application of microprocessors and microcomputers. Tutorials, review papers, and discussions are also welcome. Sample topic areas include architecture, communications, data acquisition, control, hardware and software design/implementation, algorithms (including program listings), digital signal processing, microprocessor support hardware, operating systems, computer aided design, languages, application software, and development systems.
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