成品二极管中半导体材料低极化损耗的测量

IF 0.4 4区工程技术 Q4 ENGINEERING, MULTIDISCIPLINARY

Instruments and Experimental Techniques Pub Date : 2023-05-12 DOI:10.1134/S0020441223010207

E. V. Semyonov, O. Yu. Malakhovskiy

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引用次数: 0

摘要

研究了一种测量成品二极管损耗区半导体极化损耗的方法。实验结果表明，在不稳定小气候和屏蔽电磁场的情况下，使用通用阻抗仪与低损耗电容进行比较，可以实现测量。为了消除这种情况下的漂移误差，提出了测量对象与低损耗电容的多次规则开关。测量的偏振损耗正切值为1.9 × 10−4，误差为±16%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Measurement of Low Polarization Losses of a Semiconductor Material in Finished Diodes

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Measurement of Low Polarization Losses of a Semiconductor Material in Finished Diodes

A method for the measurement of semiconductor polarization losses in the depletion region of a finished diode is considered. It is shown that the measurement can be performed by comparing with a low-loss capacitor using general-purpose impedance meters in laboratories without stabilizing the microclimate and shielding the electromagnetic fields. To exclude the drift error under these conditions, multiple regular switching of the measurement object and low-loss capacitor is proposed. As a result, the polarization loss tangent of 1.9 × 10⁻⁴ was measured with an error of ±16%.

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来源期刊

Instruments and Experimental Techniques 工程技术-工程：综合

CiteScore

1.20

自引率

33.30%

发文量

113

审稿时长

4-8 weeks

期刊介绍： Instruments and Experimental Techniques is an international peer reviewed journal that publishes reviews describing advanced methods for physical measurements and techniques and original articles that present techniques for physical measurements, principles of operation, design, methods of application, and analysis of the operation of physical instruments used in all fields of experimental physics and when conducting measurements using physical methods and instruments in astronomy, natural sciences, chemistry, biology, medicine, and ecology.