I. N. Nasyrov, I. I. Nasyrov, R. I. Nasyrov, B. A. Khairullin
{"title":"硬盘可靠性多参数评估方法","authors":"I. N. Nasyrov, I. I. Nasyrov, R. I. Nasyrov, B. A. Khairullin","doi":"10.36097/RSAN.V1I44.1607.G933","DOIUrl":null,"url":null,"abstract":"A method of multiparametric assessment of information storage devices reliability based on the dependence on the operating time of the SMART parameter values characterizing the state of hard magnetic disks in computers is presented. The parameters, with an increase in the values of which the failure probability of disk storage devices increases, are considered.","PeriodicalId":43518,"journal":{"name":"Revista San Gregorio","volume":" ","pages":""},"PeriodicalIF":0.2000,"publicationDate":"2021-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Method for Hdd Reliability Multiparametric Assessment\",\"authors\":\"I. N. Nasyrov, I. I. Nasyrov, R. I. Nasyrov, B. A. Khairullin\",\"doi\":\"10.36097/RSAN.V1I44.1607.G933\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method of multiparametric assessment of information storage devices reliability based on the dependence on the operating time of the SMART parameter values characterizing the state of hard magnetic disks in computers is presented. The parameters, with an increase in the values of which the failure probability of disk storage devices increases, are considered.\",\"PeriodicalId\":43518,\"journal\":{\"name\":\"Revista San Gregorio\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.2000,\"publicationDate\":\"2021-03-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Revista San Gregorio\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.36097/RSAN.V1I44.1607.G933\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"SOCIAL SCIENCES, INTERDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Revista San Gregorio","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.36097/RSAN.V1I44.1607.G933","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"SOCIAL SCIENCES, INTERDISCIPLINARY","Score":null,"Total":0}
Method for Hdd Reliability Multiparametric Assessment
A method of multiparametric assessment of information storage devices reliability based on the dependence on the operating time of the SMART parameter values characterizing the state of hard magnetic disks in computers is presented. The parameters, with an increase in the values of which the failure probability of disk storage devices increases, are considered.