M. Horiacha, G. Nychyporuk, Judith Bönnighausen, F. Stegemann, V. Pavlyuk, R. Pöttgen, V. Zaremba
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引用次数: 0
摘要
摘要YNiIn和YCuIn形成完整的固溶体YNiIn1−x Alx和YCuIn1−xAlx,并用x射线粉末衍射对其进行了表征。ZrNiAl型晶体结构(空间群P6‾2 m$P\overline{6}2m$)、YNiIn0.77Al0.23(a=0.73895(9),c=0.37707(4)nm,wR2=0.0498)和YCuIn0.63Al0.37(a=0.73404(7),c=0.39045(4)纳米,wR2=0.0314)。例如,研究了YNiAl的电子结构,在三维[NiAl]亚结构中表现出实质性的Ni–Al键合。与Ni–In相比,YNiAl与同型YNiIn的比较显示出更强的Ni–Al键合。YNiIn1−x Al x(x=0.1、0.2、0.7和0.9)、YNiIn和YNiAl在3–300 K温度范围内的磁化率测量表明,泡利顺磁行为的摩尔磁化率约为0.15–0.22×10−3 emu/mol。
Structure and properties of phases from solid solutions YTIn1−x Al x (T = Ni and Cu)
Abstract YNiIn and YCuIn form complete solid solutions YNiIn1−x Al x and YCuIn1−x Al x , which were characterized on the basis of X-ray powder diffraction. The ZrNiAl type crystal structures (space groups P 6 ‾ 2 m $P\overline{6}2m$ ) of YNiAl (a = 0.70386(9), c = 0.38327(4) nm, wR 2 = 0.0424), YNiIn0.77Al0.23 (a = 0.73895(9), c = 0.37707(4) nm, wR 2 = 0.0498) and YCuIn0.63Al0.37 (a = 0.73404(7), c = 0.39045(4) nm, wR 2 = 0.0314) were refined from the single crystal X-ray diffraction data. Exemplarily the electronic structure of YNiAl was studied, manifesting substantial Ni–Al bonding within the three-dimensional [NiAl] substructure. Comparison of YNiAl with isotypic YNiIn shows stronger Ni–Al bonding as compared to Ni–In. Magnetic susceptibility measurements of YNiIn1−x Al x (x = 0.1, 0.2, 0.7 and 0.9), YNiIn and YNiAl in the temperature range 3–300 K indicated Pauli paramagnetic behaviour with molar magnetic susceptibility of about 0.15–0.22 × 10−3 emu/mol.
期刊介绍:
Zeitschrift für Kristallographie – Crystalline Materials was founded in 1877 by Paul von Groth and is today one of the world’s oldest scientific journals. It offers a place for researchers to present results of their theoretical experimental crystallographic studies. The journal presents significant results on structures and on properties of organic/inorganic substances with crystalline character, periodically ordered, modulated or quasicrystalline on static and dynamic phenomena applying the various methods of diffraction, spectroscopy and microscopy.