C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
{"title":"XPS Al Kα和高能x射线光电子能谱(HAXPES) Cr Kα测量体硼","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002765","DOIUrl":null,"url":null,"abstract":"Bulk boron was analyzed using both XPS and high-resolution high energy x-ray photoelectron spectroscopy. The spectra of boron obtained using monochromatic Al Kα radiation include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, and Ar 2p. The Cr Kα spectra with radiation at 5414.8 eV include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, Ar 2p, and Ar 1s.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.6000,"publicationDate":"2023-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"XPS Al Kα and high energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk boron\",\"authors\":\"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard\",\"doi\":\"10.1116/6.0002765\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Bulk boron was analyzed using both XPS and high-resolution high energy x-ray photoelectron spectroscopy. The spectra of boron obtained using monochromatic Al Kα radiation include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, and Ar 2p. The Cr Kα spectra with radiation at 5414.8 eV include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, Ar 2p, and Ar 1s.\",\"PeriodicalId\":22006,\"journal\":{\"name\":\"Surface Science Spectra\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2023-08-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Surface Science Spectra\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1116/6.0002765\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Surface Science Spectra","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1116/6.0002765","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
XPS Al Kα and high energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk boron
Bulk boron was analyzed using both XPS and high-resolution high energy x-ray photoelectron spectroscopy. The spectra of boron obtained using monochromatic Al Kα radiation include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, and Ar 2p. The Cr Kα spectra with radiation at 5414.8 eV include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, Ar 2p, and Ar 1s.
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