纳米结构硅质谱表面的电化学传感

Tsao Cw, Guo Zm
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引用次数: 0

摘要

质谱(MS)是一种广泛使用的分析工具,可提供分析物的定量信息(分子量和强度)。纳米结构硅基表面辅助解吸/电离质谱(LDI-MS)具有无基体和高灵敏度的优点。然而,质谱仪是一种大型且昂贵的工具,限制了现场筛选或即时检测的应用。另一方面,电化学传感是一种简单且成本较低的检测方法,可用于便携式现场筛选。如果纳米结构硅(nSi)表面可以用于电化学传感,它打开了将nSi表面用于电化学传感和质谱(MS)检测的可能性。因此,在本文中,我们证明了使用nSi表面进行电化学传感的可行性。考察了主要nSi表面工艺参数(金属辅助蚀刻时间和化学镀金时间)对电化学性能的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electrochemical Sensing on a Nanostructured Silicon Mass Spectrometry Surface
Mass Spectrometry (MS) is a widely used analytical tool that provides quantitive information (molecule weight and intensity) of the analyte. Nanostructured silicon-based surface-assisted desorption/ionization mass spectrometry (LDI-MS) provides matrix-free and high sensitivity advantages. However, the mass spectrometer is a large and expensive tool limiting the onsite screening or point-of-care testing applications. Electrochemical sensing, on the other hand, is a simple and less-expensive detection method that can be used as portable onsite screening purposes. If the nanostructure silicon (nSi) surface can be used for electrochemical sensing, it opens the possibility of using nSi surface for both electrochemical sensing and Mass Spectrometry (MS) detection. Therefore, in this paper, we demonstrate the feasibility of using nSi surface for electrochemical sensing. Effects of the major nSi surface process parameters, including metal-assisted etching time and electroless Au decoration/deposition time to the electrochemical was evaluated.
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