{"title":"测试高分辨率光谱分析仪表征模拟光链路与外部调制","authors":"V. A. Nebavskiy, R. Starikov","doi":"10.1007/s11018-023-02177-x","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18352,"journal":{"name":"Measurement Techniques","volume":" 40","pages":"1-8"},"PeriodicalIF":0.5000,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Testing High-Resolution Optical Spectrum Analyzers for Characterization of Analog Optical Links with External Modulation\",\"authors\":\"V. A. Nebavskiy, R. Starikov\",\"doi\":\"10.1007/s11018-023-02177-x\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":18352,\"journal\":{\"name\":\"Measurement Techniques\",\"volume\":\" 40\",\"pages\":\"1-8\"},\"PeriodicalIF\":0.5000,\"publicationDate\":\"2023-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Measurement Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/s11018-023-02177-x\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measurement Techniques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s11018-023-02177-x","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
期刊介绍:
Measurement Techniques contains articles of interest to all who are engaged in the study and application of fundamental measurements.
Topics covered include:
General problems of metrology;
Uniformity of measurement results;
Measurement standards of the units of physical quantities;
Measurement methods;
New measurement techniques in all fields of measurement (linear, mechanical, electromagnetic, optical, time and frequency, thermo-technical, ionising radiations etc.).