应变层半导体的局部结构测定

IF 8.2 1区化学 Q1 CHEMISTRY, PHYSICAL

Surface Science Reports Pub Date : 2014-03-01 DOI:10.1016/j.surfrep.2013.12.002

Joseph C. Woicik

{"title":"应变层半导体的局部结构测定","authors":"Joseph C. Woicik","doi":"10.1016/j.surfrep.2013.12.002","DOIUrl":null,"url":null,"abstract":"<div>The theory of elasticity accurately describes the deformations of macroscopic bodies under the action of applied stress [1]. In this review, we examine the internal mechanisms of elasticity for strained-layer semiconductor heterostructures. In particular, we present extended x-ray-absorption fine structure (EXAFS) and x-ray diffraction (XRD) measurements to show how the bond lengths and bond angles in semiconductor thin-alloy films change with strain when they are grown coherently on substrates with different lattice constants. The structural distortions measured by experiment are compared to valence-force field (VFF) calculations and other theoretical models. Atomic switching and interfacial strain at buried interfaces are also discussed.</div>","PeriodicalId":434,"journal":{"name":"Surface Science Reports","volume":"69 1","pages":"Pages 38-53"},"PeriodicalIF":8.2000,"publicationDate":"2014-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/j.surfrep.2013.12.002","citationCount":"7","resultStr":"{\"title\":\"Local structure determination in strained-layer semiconductors\",\"authors\":\"Joseph C. Woicik\",\"doi\":\"10.1016/j.surfrep.2013.12.002\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div>The theory of elasticity accurately describes the deformations of macroscopic bodies under the action of applied stress [1]. In this review, we examine the internal mechanisms of elasticity for strained-layer semiconductor heterostructures. In particular, we present extended x-ray-absorption fine structure (EXAFS) and x-ray diffraction (XRD) measurements to show how the bond lengths and bond angles in semiconductor thin-alloy films change with strain when they are grown coherently on substrates with different lattice constants. The structural distortions measured by experiment are compared to valence-force field (VFF) calculations and other theoretical models. Atomic switching and interfacial strain at buried interfaces are also discussed.</div>\",\"PeriodicalId\":434,\"journal\":{\"name\":\"Surface Science Reports\",\"volume\":\"69 1\",\"pages\":\"Pages 38-53\"},\"PeriodicalIF\":8.2000,\"publicationDate\":\"2014-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/j.surfrep.2013.12.002\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Surface Science Reports\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0167572913000356\",\"RegionNum\":1,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Surface Science Reports","FirstCategoryId":"92","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167572913000356","RegionNum":1,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}

引用次数: 7

摘要

弹性理论准确地描述了宏观物体在外加应力作用下的变形[1]。在这篇综述中，我们研究了应变层半导体异质结构的内部弹性机制。特别地，我们提出了扩展x射线吸收精细结构(EXAFS)和x射线衍射(XRD)测量，以显示半导体薄合金薄膜在不同晶格常数的衬底上相干生长时，键长和键角是如何随应变变化的。实验测量的结构畸变与价力场计算和其他理论模型进行了比较。讨论了埋藏界面处的原子开关和界面应变。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Local structure determination in strained-layer semiconductors

The theory of elasticity accurately describes the deformations of macroscopic bodies under the action of applied stress [1]. In this review, we examine the internal mechanisms of elasticity for strained-layer semiconductor heterostructures. In particular, we present extended x-ray-absorption fine structure (EXAFS) and x-ray diffraction (XRD) measurements to show how the bond lengths and bond angles in semiconductor thin-alloy films change with strain when they are grown coherently on substrates with different lattice constants. The structural distortions measured by experiment are compared to valence-force field (VFF) calculations and other theoretical models. Atomic switching and interfacial strain at buried interfaces are also discussed.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Surface Science Reports 化学-物理：凝聚态物理

CiteScore

15.90

自引率

2.00%

发文量

审稿时长

178 days

期刊介绍： Surface Science Reports is a journal that specializes in invited review papers on experimental and theoretical studies in the physics, chemistry, and pioneering applications of surfaces, interfaces, and nanostructures. The topics covered in the journal aim to contribute to a better understanding of the fundamental phenomena that occur on surfaces and interfaces, as well as the application of this knowledge to the development of materials, processes, and devices. In this journal, the term "surfaces" encompasses all interfaces between solids, liquids, polymers, biomaterials, nanostructures, soft matter, gases, and vacuum. Additionally, the journal includes reviews of experimental techniques and methods used to characterize surfaces and surface processes, such as those based on the interactions of photons, electrons, and ions with surfaces.