Orienting and polishing single crystals for ultrasonic measurements.

Some simple but adequate methods of orienting and polishing large single crystals for ultrasonic measurements are described. These methods are useful for a variety of materials, particularly for metals and ionic crystals. Included are an x-ray method of measuring orientation and a description of fixtures and procedures involved in polishing. The use of these techniques on low lineage crystals can result in orientation accuracies of less than ½°, flatness of 5 × 10−6 in, and parallelism of 2 seconds of arc with moderate means and effort.