{"title":"用于多晶x射线结构分析的背反射聚焦相机KPF-150。","authors":"G V Davydov","doi":"10.1088/0022-3735/1/8/435","DOIUrl":null,"url":null,"abstract":"In this note a camera is discussed for X-ray structural analysis of polycrystals, where the sharp focus of a tube, the sample and the reflection are placed upon the focusing circle.","PeriodicalId":16983,"journal":{"name":"Journal of Scientific Instruments","volume":"1 8","pages":"876-7"},"PeriodicalIF":0.0000,"publicationDate":"1968-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1088/0022-3735/1/8/435","citationCount":"1","resultStr":"{\"title\":\"A back-reflection focusing camera KPF-150 for x-ray structural analysis of polycrystals.\",\"authors\":\"G V Davydov\",\"doi\":\"10.1088/0022-3735/1/8/435\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this note a camera is discussed for X-ray structural analysis of polycrystals, where the sharp focus of a tube, the sample and the reflection are placed upon the focusing circle.\",\"PeriodicalId\":16983,\"journal\":{\"name\":\"Journal of Scientific Instruments\",\"volume\":\"1 8\",\"pages\":\"876-7\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1968-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1088/0022-3735/1/8/435\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Scientific Instruments\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/0022-3735/1/8/435\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Scientific Instruments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0022-3735/1/8/435","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A back-reflection focusing camera KPF-150 for x-ray structural analysis of polycrystals.
In this note a camera is discussed for X-ray structural analysis of polycrystals, where the sharp focus of a tube, the sample and the reflection are placed upon the focusing circle.
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